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Results: 1-25 | 26-50 | 51-75 | 76-78

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Results: 1-25/78

Authors: Dittes, M
Citation: M. Dittes, Green packages - Requirements, materials, results, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 1-5

Authors: Garner, CM Gupta, V Bissessur, V Kumar, A Aspandiar, R
Citation: Cm. Garner et al., Challenges in converting to lead-free electronics, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 6-9

Authors: Solberg, V
Citation: V. Solberg, Board level reliability testing of mu BGA (R) packaging with lead-free solder attachment, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 10-14

Authors: Cada, LG Lalanto, R Coronel, G San Gregorio, V Asis, D Ong, G Ducusin, C Desengano, R Llamas, T Decena, R Canares, N Reyes, A Miciano, P
Citation: Lg. Cada et al., Manufacturability and reliability of non-halogenated molding compounds, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 15-20

Authors: Tummala, RR Wong, CP Chan, YC
Citation: Rr. Tummala et al., Microelectronic packaging and assembly roadmap for Hong Kong and Pearl River Delta region: A team study and recommendations, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 21-23

Authors: Beelen-Hendrikx, C Verguld, M
Citation: C. Beelen-hendrikx et M. Verguld, Trends in electronic packaging and assembly for portable consumer products, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 24-32

Authors: Yeoh, HP Lii, MJ Sankman, B Azimi, H
Citation: Hp. Yeoh et al., Flip chip pin grid array (FC-PGA) packaging technology, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 33-40

Authors: Aschenbrenner, R Ostmann, A Jung, E Landesberger, C Reichl, H
Citation: R. Aschenbrenner et al., A new approach for system integrated packaging, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 41-45

Authors: Szekely, V Rencz, M Poppe, A Courtois, B
Citation: V. Szekely et al., New hardware tools for the thermal transient testing of packages, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 46-52

Authors: Cheah, TS Seetharamu, KN Ghulam, AQ Zainal, ZA Sundararajan, T
Citation: Ts. Cheah et al., Numerical modeling of microscale heat conduction effects in electronic package for different thermal boundary conditions, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 53-59

Authors: Khan, N",Pinjala,"Iyer, MK Chuan, TK Jin, WX
Citation: Mk. Khan, N",pinjala,"iyer et al., Thermal enhancement of desk top computer by chassis design optimization, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 60-64

Authors: Goh, TJ Amir, AN Chiu, CP Torresola, J
Citation: Tj. Goh et al., Cartridge thermal design of Pentium (R) !!! processor for workstation: Giga hertz technology envelope extension challenges, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 65-71

Authors: Chan, CF Lahiri, SK Yuan, P How, JBH
Citation: Cf. Chan et al., An intermetallic study of solder joints with Sn-Ag-Cu lead-free solder, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 72-80

Authors: Kim, SJ Bae, KS
Citation: Sj. Kim et Ks. Bae, Interdiffusion between Cu and Sn-rich solder: Dominant diffusion species, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 81-85

Authors: Huang, XJ Lee, SWR Tse, WS
Citation: Xj. Huang et al., Experimental characterization for the shear strength of Pb-free solder balls on a PZT substrate with Pd/Ag pads, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 86-90

Authors: Ohnuma, I Liu, XJ Ohtani, H Anzai, K Kainuma, R Ishida, K
Citation: I. Ohnuma et al., Development of thermodynamic database for micro-soldering alloys, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 91-96

Authors: Bailey, C Lu, H Wheeler, D
Citation: C. Bailey et al., Predicting the movement of voids in solder bumps and subsequent reliability, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 97-102

Authors: Mannan, SH Wheeler, D Hutt, DA Whalley, DC Conway, PP Bailey, C
Citation: Sh. Mannan et al., Solder paste reflow modeling for flip chip assembly, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 103-109

Authors: Chiang, KN Chang, CW Lin, JD
Citation: Kn. Chiang et al., Analysis of ACA/ACF package using equivalent spring method, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 110-116

Authors: Dreyer, W Muller, WH
Citation: W. Dreyer et Wh. Muller, Quantitative modeling of diffusional coarsening in eutectic tin/lead solders, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 117-123

Authors: Long, TK Li, GM Seetharamu, KN Hassan, AY
Citation: Tk. Long et al., A fresh look at thermal resistance in electronic packages, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 124-130

Authors: Loh, CV Toh, KC Pinjala, D Iyer, MK
Citation: Cv. Loh et al., Development of effective compact models for depopulated ball grid array packages, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 131-137

Authors: Parthiban, A Jeevan, K Seetharamu, KN Azid, IA
Citation: A. Parthiban et al., Evolutionary genetic approach to determine junction temperature in electronic packages, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 138-143

Authors: Pinjala, D Iyer, MK Guan, CS Rasiah, IJ
Citation: D. Pinjala et al., Thermal characterization of vias using compact models, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 144-147

Authors: Zhu, H Guo, YF Li, WY Tseng, AA Martin, B
Citation: H. Zhu et al., Micro-mechanical characterization of solder mask materials, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 148-153
Risultati: 1-25 | 26-50 | 51-75 | 76-78