Login
|
New Account
AAAAAA
ITA
ENG
Results:
1-25
|
26-26
Table of contents of journal:
Results: 1-25/26
Basic ray optics
Authors:
Stavroudis, O
Citation:
O. Stavroudis, Basic ray optics, OPT ENGIN, 73, 2001, pp. 1-38
Basic wave optics
Authors:
Boreman, GD
Citation:
Gd. Boreman, Basic wave optics, OPT ENGIN, 73, 2001, pp. 39-73
Basic photon optics
Authors:
Acosta-Ortiz, SE
Citation:
Se. Acosta-ortiz, Basic photon optics, OPT ENGIN, 73, 2001, pp. 75-124
Prisms and refractive optical components
Authors:
Malacara, D Moore, DT
Citation:
D. Malacara et Dt. Moore, Prisms and refractive optical components, OPT ENGIN, 73, 2001, pp. 125-146
Reflective optical components
Authors:
Malacara, D
Citation:
D. Malacara, Reflective optical components, OPT ENGIN, 73, 2001, pp. 147-156
Diffractive optical components
Authors:
Solano, C
Citation:
C. Solano, Diffractive optical components, OPT ENGIN, 73, 2001, pp. 157-189
Some lens optical devices
Authors:
Malacara, D
Citation:
D. Malacara, Some lens optical devices, OPT ENGIN, 73, 2001, pp. 191-205
Telescopes
Authors:
Paez, G Strojnik, M
Citation:
G. Paez et M. Strojnik, Telescopes, OPT ENGIN, 73, 2001, pp. 207-261
Spectrometers
Authors:
Wolfe, W
Citation:
W. Wolfe, Spectrometers, OPT ENGIN, 73, 2001, pp. 263-309
Wavefront slope measurements in optical testing
Authors:
Cornejo-Rodriguez, A Cordeno-Davila, A
Citation:
A. Cornejo-rodriguez et A. Cordeno-davila, Wavefront slope measurements in optical testing, OPT ENGIN, 73, 2001, pp. 311-337
Basic interferometers
Authors:
Malacara, D
Citation:
D. Malacara, Basic interferometers, OPT ENGIN, 73, 2001, pp. 339-371
Modern fringe pattern analysis in interferometry
Authors:
Servin, M Kujawinska, M
Citation:
M. Servin et M. Kujawinska, Modern fringe pattern analysis in interferometry, OPT ENGIN, 73, 2001, pp. 373-426
Optical methods in metrology: Point methods
Authors:
Malacara, HZ Rodriguez-Vera, R
Citation:
Hz. Malacara et R. Rodriguez-vera, Optical methods in metrology: Point methods, OPT ENGIN, 73, 2001, pp. 427-491
Optical metrology of diffuse objects: Full-field methods
Authors:
Kujawinska, M Malacara, D
Citation:
M. Kujawinska et D. Malacara, Optical metrology of diffuse objects: Full-field methods, OPT ENGIN, 73, 2001, pp. 493-522
Holography
Authors:
Vikram, CS
Citation:
Cs. Vikram, Holography, OPT ENGIN, 73, 2001, pp. 523-550
Fourier optics and image processing
Authors:
Yu, FTS
Citation:
Fts. Yu, Fourier optics and image processing, OPT ENGIN, 73, 2001, pp. 551-594
Electro-optical and acousto-optical devices
Authors:
Karim, MA
Citation:
Ma. Karim, Electro-optical and acousto-optical devices, OPT ENGIN, 73, 2001, pp. 595-648
Radiometry
Authors:
Strojnik, M Paez, G
Citation:
M. Strojnik et G. Paez, Radiometry, OPT ENGIN, 73, 2001, pp. 649-699
Incoherent light sources
Authors:
Malacara, HZ
Citation:
Hz. Malacara, Incoherent light sources, OPT ENGIN, 73, 2001, pp. 701-717
Lasers
Authors:
Aboites, V
Citation:
V. Aboites, Lasers, OPT ENGIN, 73, 2001, pp. 719-741
Spatial and spectral filters
Authors:
Macleod, A
Citation:
A. Macleod, Spatial and spectral filters, OPT ENGIN, 73, 2001, pp. 743-774
Optical fibers and accessories
Authors:
Starodumov, AN
Citation:
An. Starodumov, Optical fibers and accessories, OPT ENGIN, 73, 2001, pp. 775-825
Isotropic amorphous optical materials
Authors:
Regalado, LE Malacara, D
Citation:
Le. Regalado et D. Malacara, Isotropic amorphous optical materials, OPT ENGIN, 73, 2001, pp. 827-846
Anisotropic materials
Authors:
Goldstein, DH
Citation:
Dh. Goldstein, Anisotropic materials, OPT ENGIN, 73, 2001, pp. 847-878
Light-sensitive materials: Silver halide emulsions, photoresist and photopolymers
Authors:
Calixto, S Lougnot, DJ
Citation:
S. Calixto et Dj. Lougnot, Light-sensitive materials: Silver halide emulsions, photoresist and photopolymers, OPT ENGIN, 73, 2001, pp. 879-913
Risultati:
1-25
|
26-26