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Table of contents of journal:
Results: 10
Spectroscopy in process analysis - Introduction
Authors:
Chalmers, JM
Citation:
Jm. Chalmers, Spectroscopy in process analysis - Introduction, SHEFF ANALY, 2000, pp. 1-15
UV-visible, fluorescence and chemiluminescence spectroscopies in chemical process analysis
Authors:
Herman, H
Citation:
H. Herman, UV-visible, fluorescence and chemiluminescence spectroscopies in chemical process analysis, SHEFF ANALY, 2000, pp. 16-52
Near-infrared spectroscopy in chemical process analysis
Authors:
Ozaki, Y Amari, T
Citation:
Y. Ozaki et T. Amari, Near-infrared spectroscopy in chemical process analysis, SHEFF ANALY, 2000, pp. 53-95
Mid-infrared spectroscopy in chemical process analysis
Authors:
Vidrine, DW
Citation:
Dw. Vidrine, Mid-infrared spectroscopy in chemical process analysis, SHEFF ANALY, 2000, pp. 96-138
Raman spectroscopy in chemical process analysis
Authors:
Leugers, MA Lipp, ED
Citation:
Ma. Leugers et Ed. Lipp, Raman spectroscopy in chemical process analysis, SHEFF ANALY, 2000, pp. 139-164
Atomic spectrometry in chemical process analysis
Authors:
Marshall, J
Citation:
J. Marshall, Atomic spectrometry in chemical process analysis, SHEFF ANALY, 2000, pp. 165-208
Mass spectrometry in chemical process analysis
Authors:
Colin, TB
Citation:
Tb. Colin, Mass spectrometry in chemical process analysis, SHEFF ANALY, 2000, pp. 209-233
Magnetic resonance techniques in process analysis
Authors:
Prado, PJ Blumich, B Balcom, BJ
Citation:
Pj. Prado et al., Magnetic resonance techniques in process analysis, SHEFF ANALY, 2000, pp. 234-283
Sampling and engineering considerations
Authors:
Maestro, J
Citation:
J. Maestro, Sampling and engineering considerations, SHEFF ANALY, 2000, pp. 284-335
Chemometrics and data treatment
Authors:
Walmsley, AD
Citation:
Ad. Walmsley, Chemometrics and data treatment, SHEFF ANALY, 2000, pp. 336-372
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