Authors:
WENK HR
MATTHIES S
DONOVAN J
CHATEIGNER D
Citation: Hr. Wenk et al., BEARTEX - A WINDOWS-BASED PROGRAM SYSTEM FOR QUANTITATIVE TEXTURE ANALYSIS, Journal of applied crystallography, 31, 1998, pp. 262-269
Citation: J. Badger et R. Athay, AUTOMATED AND GRAPHICAL METHODS FOR LOCATING HEAVY-ATOM SITES FOR ISOMORPHOUS REPLACEMENT AND MULTIWAVELENGTH ANOMALOUS DIFFRACTION PHASE DETERMINATION, Journal of applied crystallography, 31, 1998, pp. 270-274
Citation: Da. Langs, PROGRAM TO GENERATE AND EVALUATE 3-PHASE STRUCTURE-INVARIANT OMEGA-ESTIMATES FROM SINGLE-WAVELENGTH ANOMALOUS-DISPERSION DATA, Journal of applied crystallography, 31, 1998, pp. 275-277
Citation: Hj. Bernstein et Sr. Hall, CIF APPLICATIONS - VII - CYCLOPS2 - EXTENDING THE VALIDATION OF CIF DATA NAMES, Journal of applied crystallography, 31, 1998, pp. 278-281
Citation: Hj. Bernstein et al., CIF APPLICATIONS - VIII - PDB2CIF - TRANSLATING PDB ENTRIES INTO MMCIF FORMAT, Journal of applied crystallography, 31, 1998, pp. 282-295
Citation: A. Darovsky et P. Coppens, A DEVICE FOR LOW-TEMPERATURE CRYSTAL REORIENTATION IN DATA-COLLECTIONWITH THE OSCILLATION METHOD, Journal of applied crystallography, 31, 1998, pp. 296-298
Citation: Ja. Rollings et al., A HIGH-TRANSMISSION FURNACE INSERT FOR NEUTRON POWDER DIFFRACTION STUDIES AT HIGH-TEMPERATURES UNDER A PRESSURIZED REACTIVE ATMOSPHERE, Journal of applied crystallography, 31, 1998, pp. 299-301
Citation: J. Zaleski et al., ON THE CORRECTION OF REFLECTION INTENSITIES RECORDED ON IMAGING PLATES FOR INCOMPLETE ABSORPTION IN THE PHOSPHOR LAYER, Journal of applied crystallography, 31, 1998, pp. 302-304
Citation: Zg. Chai et Cf. Meng, SMALL-ANGLE X-RAY-SCATTERING STUDY OF THE INTERFACIAL CHARACTERISTICSBETWEEN DELTA'-PHASE AND DELTA'-MATRIX IN AL-2.70 MASS-PERCENT LI ALLOY, Journal of applied crystallography, 31, 1998, pp. 7-9
Citation: U. Peuchert et al., AB-INITIO STRUCTURE SOLUTION AND RIETVELD REFINEMENT OF THE HIGH-TEMPERATURE K2MGWO2(PO4)(2) PHASE (T = 773 K) FROM X-RAY-POWDER DIFFRACTION DATA, Journal of applied crystallography, 31, 1998, pp. 10-15
Citation: Mag. Aranda et al., EFFECTIVE CORRECTION OF PEAK ASYMMETRY - RIETVELD REFINEMENT OF HIGH-RESOLUTION SYNCHROTRON POWDER DATA OF LI-1.8(HF1.2FE0.8)(PO4)(3), Journal of applied crystallography, 31, 1998, pp. 16-21
Citation: D. Bourgeois et al., AN INTEGRATION ROUTINE BASED ON PROFILE FITTING WITH OPTIMIZED FITTING AREA FOR THE EVALUATION OF WEAK AND OR OVERLAPPED 2-DIMENSIONAL LAUEOR MONOCHROMATIC PATTERNS/, Journal of applied crystallography, 31, 1998, pp. 22-35
Citation: M. Pilard et Y. Epelboin, MULTIRESOLUTION ANALYSIS FOR THE RESTORATION OF NOISY X-RAY TOPOGRAPHS, Journal of applied crystallography, 31, 1998, pp. 36-46
Citation: Tm. Sabine et al., ANALYTICAL EXPRESSIONS FOR THE TRANSMISSION FACTOR AND PEAK SHIFT IN ABSORBING CYLINDRICAL SPECIMENS, Journal of applied crystallography, 31, 1998, pp. 47-51
Citation: Xl. Wang et al., THEORY OF THE PEAK SHIFT ANOMALY DUE TO PARTIAL BURIAL OF THE SAMPLING VOLUME IN NEUTRON-DIFFRACTION RESIDUAL-STRESS MEASUREMENTS, Journal of applied crystallography, 31, 1998, pp. 52-59
Citation: L. Duclaux et al., THE LOW-TEMPERATURE 3-DIMENSIONAL STRUCTURES OF THE 2ND-STAGE CESIUM GRAPHITIDE, Journal of applied crystallography, 31, 1998, pp. 67-73
Authors:
ALTOMARE A
FOADI J
GIACOVAZZO C
MOLITERNI AGG
BURLA MC
POLIDORI G
Citation: A. Altomare et al., SOLVING CRYSTAL-STRUCTURES FROM POWDER DATA - IV - THE USE OF PATTERSON INFORMATION FOR ESTIMATING THE VERTICAL-BAR-F-VERTICAL-BAR-S, Journal of applied crystallography, 31, 1998, pp. 74-77
Citation: P. Riello et al., QUANTITATIVE PHASE-ANALYSIS IN SEMICRYSTALLINE MATERIALS USING THE RIETVELD METHOD, Journal of applied crystallography, 31, 1998, pp. 78-82
Citation: Gk. Doherty et Ga. Poland, MC-DDF, A COMPUTER-PROGRAM FOR GENERATING DISTANCE DISTRIBUTION-FUNCTIONS FROM MODEL PARTICLES USING MONTE-CARLO CHORD SAMPLING, Journal of applied crystallography, 31, 1998, pp. 83-90
Citation: Y. Kuroiwa et al., INPLANE LOCAL ARRANGEMENTS OF AG ATOMS IN THE STAGE-2 INTERCALATION COMPOUND AG0.15TIS2, Journal of applied crystallography, 31, 1998, pp. 91-93
Citation: T. Lippmann et al., POLARIZED X-RAY-ABSORPTION - EVIDENCE OF ORIENTATIONAL DISPERSION IN HORNBLENDE MINERALS, Journal of applied crystallography, 31, 1998, pp. 94-97
Citation: O. Bergstrom et al., AN X-RAY-POWDER DIFFRACTION ATTACHMENT FOR IN-SITU STUDIES OF ION INSERTION PROCESSES IN ELECTRODE MATERIALS, Journal of applied crystallography, 31, 1998, pp. 103-105