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Authors: Sinha, BK Chaudhuri, G
Citation: Bk. Sinha et G. Chaudhuri, Complete confounding in a two-component series system: Status of bivariateexponentials, S QUAL REL, 4, 1998, pp. 361-366

Authors: Tiwari, RC Zalkikar, JN
Citation: Rc. Tiwari et Jn. Zalkikar, Distribution-free tests for two crossing cumulative incidence functions, S QUAL REL, 4, 1998, pp. 367-378

Authors: Tsokos, CP
Citation: Cp. Tsokos, Ordinary and Bayesian approach to life testing using the extreme value distribution, S QUAL REL, 4, 1998, pp. 379-395

Authors: Walsh, CD Wilson, SP
Citation: Cd. Walsh et Sp. Wilson, Reliability modelling and inference through fatigue crack growth, S QUAL REL, 4, 1998, pp. 397-410

Authors: Xie, M Tan, KC Goh, KH
Citation: M. Xie et al., Fault tree reduction for reliability analysis and improvement, S QUAL REL, 4, 1998, pp. 411-428

Authors: Mukherjee, SP
Citation: Sp. Mukherjee, Purnendu Kumar Bose: A brief biography, S QUAL REL, 4, 1998, pp. VII-VIII
Risultati: 1-25 | 26-31 |