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Results: 1-15 |

Table of contents of journal:

Results: 15
Modern techniques employed for characterizing surfactant systems
Authors: Binks, BP
Citation: Bp. Binks, Modern techniques employed for characterizing surfactant systems, SURF SC S, 83, 1999, pp. 3-61
Scanning tunneling microscopy at solid-liquid interfaces
Authors: Rabe, JP
Citation: Jp. Rabe, Scanning tunneling microscopy at solid-liquid interfaces, SURF SC S, 83, 1999, pp. 65-82
Atomic force microscopy
Authors: Scales, PJ
Citation: Pj. Scales, Atomic force microscopy, SURF SC S, 83, 1999, pp. 83-108
Brewster angle microscopy and ellipsometry
Authors: Henon, S Meunier, J
Citation: S. Henon et J. Meunier, Brewster angle microscopy and ellipsometry, SURF SC S, 83, 1999, pp. 109-145
Cryogenic temperature transmission electron microscopy in the study of surfactant systems
Authors: Talmon, Y
Citation: Y. Talmon, Cryogenic temperature transmission electron microscopy in the study of surfactant systems, SURF SC S, 83, 1999, pp. 147-178
Optical techniques for the characterization of monolayers and thin liquid films
Authors: Langevin, D
Citation: D. Langevin, Optical techniques for the characterization of monolayers and thin liquid films, SURF SC S, 83, 1999, pp. 181-212
Fluorescence and ESR spectroscopy
Authors: Somasundaran, P Huang, L Fan, AX
Citation: P. Somasundaran et al., Fluorescence and ESR spectroscopy, SURF SC S, 83, 1999, pp. 213-254
Studies of interactions between interfaces across surfactant solutions employing various surface force techniques
Authors: Claesson, PM Kjellin, URM
Citation: Pm. Claesson et Urm. Kjellin, Studies of interactions between interfaces across surfactant solutions employing various surface force techniques, SURF SC S, 83, 1999, pp. 255-333
Non-linear optical techniques
Authors: Bain, CD
Citation: Cd. Bain, Non-linear optical techniques, SURF SC S, 83, 1999, pp. 335-373
Amphiphiles at interfaces studied by surface sensitive X-ray scattering
Authors: Lang, P
Citation: P. Lang, Amphiphiles at interfaces studied by surface sensitive X-ray scattering, SURF SC S, 83, 1999, pp. 377-415
Neutron reflectivity at liquid-vapor, liquid-liquid, and solid-liquid interfaces
Authors: Thomas, RK
Citation: Rk. Thomas, Neutron reflectivity at liquid-vapor, liquid-liquid, and solid-liquid interfaces, SURF SC S, 83, 1999, pp. 417-479
Quartz Crystal Microbalance
Authors: Furlong, DN
Citation: Dn. Furlong, Quartz Crystal Microbalance, SURF SC S, 83, 1999, pp. 481-519
Electroacoustic studies of surfactant adsorption
Authors: Hunter, RJ
Citation: Rj. Hunter, Electroacoustic studies of surfactant adsorption, SURF SC S, 83, 1999, pp. 521-550
Ultrasonic characterization of surfactant-containing systems
Authors: Povey, MJW
Citation: Mjw. Povey, Ultrasonic characterization of surfactant-containing systems, SURF SC S, 83, 1999, pp. 551-593
Modern characterization methods of surfactant systems - Preface
Authors: Binks, BP
Citation: Bp. Binks, Modern characterization methods of surfactant systems - Preface, SURF SC S, 83, 1999, pp. III-IV
Risultati: 1-15 |