Table of contents of journal:

Results: 26-42/42

Detergents and cleaners: Phase analysis of sodium phosphates

Authors: Quail, TF Chun, JKM

Citation: Tf. Quail et Jkm. Chun, Detergents and cleaners: Phase analysis of sodium phosphates, INDUSTRIAL APPLICATIONS OF X-RAY DIFFRACTION, 2000, pp. 609-619

Museum: Art and archaeology

Authors: Mantler, M Schreiner, M Schweizer, F

Citation: M. Mantler et al., Museum: Art and archaeology, INDUSTRIAL APPLICATIONS OF X-RAY DIFFRACTION, 2000, pp. 621-658

Forensic science: Every contact leaves a trace

Authors: Rendle, DF

Citation: Df. Rendle, Forensic science: Every contact leaves a trace, INDUSTRIAL APPLICATIONS OF X-RAY DIFFRACTION, 2000, pp. 659-675

US Customs laboratories

Authors: Liberman, MH

Citation: Mh. Liberman, US Customs laboratories, INDUSTRIAL APPLICATIONS OF X-RAY DIFFRACTION, 2000, pp. 677-685

Commercial service laboratory

Authors: Schreiner, WN

Citation: Wn. Schreiner, Commercial service laboratory, INDUSTRIAL APPLICATIONS OF X-RAY DIFFRACTION, 2000, pp. 687-704

Synchrotron usage by industry

Authors: Harlow, R

Citation: R. Harlow, Synchrotron usage by industry, INDUSTRIAL APPLICATIONS OF X-RAY DIFFRACTION, 2000, pp. 705-731

Electron microscopy in industry

Authors: Li, ZG

Citation: Zg. Li, Electron microscopy in industry, INDUSTRIAL APPLICATIONS OF X-RAY DIFFRACTION, 2000, pp. 733-749

Line profiles and sample microstructure

Authors: Langford, JI

Citation: Ji. Langford, Line profiles and sample microstructure, INDUSTRIAL APPLICATIONS OF X-RAY DIFFRACTION, 2000, pp. 751-775

Thin films and multilayers

Authors: Fewster, PF

Citation: Pf. Fewster, Thin films and multilayers, INDUSTRIAL APPLICATIONS OF X-RAY DIFFRACTION, 2000, pp. 777-791

Residual stress and stress gradients

Authors: Kraus, I Ganev, N

Citation: I. Kraus et N. Ganev, Residual stress and stress gradients, INDUSTRIAL APPLICATIONS OF X-RAY DIFFRACTION, 2000, pp. 793-811

Residual stress development and texture formation during rolling contact loading

Authors: Voskamp, AP Mittemeijer, EJ

Citation: Ap. Voskamp et Ej. Mittemeijer, Residual stress development and texture formation during rolling contact loading, INDUSTRIAL APPLICATIONS OF X-RAY DIFFRACTION, 2000, pp. 813-846

Warren-Averbach applications

Authors: Ungar, T

Citation: T. Ungar, Warren-Averbach applications, INDUSTRIAL APPLICATIONS OF X-RAY DIFFRACTION, 2000, pp. 847-867

Microbeam crystallographic and elemental analysis

Authors: Goehner, RP Eatough, MO Michael, JR Tissot, RG

Citation: Rp. Goehner et al., Microbeam crystallographic and elemental analysis, INDUSTRIAL APPLICATIONS OF X-RAY DIFFRACTION, 2000, pp. 869-890

High-temperature and nonambient x-ray diffraction

Authors: Rodriguez, M

Citation: M. Rodriguez, High-temperature and nonambient x-ray diffraction, INDUSTRIAL APPLICATIONS OF X-RAY DIFFRACTION, 2000, pp. 891-902

NIST standard reference materials for characterization of instrument performance

Authors: Cline, JP

Citation: Jp. Cline, NIST standard reference materials for characterization of instrument performance, INDUSTRIAL APPLICATIONS OF X-RAY DIFFRACTION, 2000, pp. 903-917

Grain orientation and texture

Authors: Bunge, HJ

Citation: Hj. Bunge, Grain orientation and texture, INDUSTRIAL APPLICATIONS OF X-RAY DIFFRACTION, 2000, pp. 919-974

Structure analysis from powder data

Authors: Louer, D

Citation: D. Louer, Structure analysis from powder data, INDUSTRIAL APPLICATIONS OF X-RAY DIFFRACTION, 2000, pp. 975-992

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