Login
|
New Account
AAAAAA
ITA
ENG
Results:
1-12
|
Table of contents of journal:
Results: 12
Thermal ionization mass spectrometry
Authors:
Smith, DH
Citation:
Dh. Smith, Thermal ionization mass spectrometry, PRAC SPECTR, 23, 2000, pp. 1-30
Glow discharge mass spectrometry
Authors:
Barshick, CM
Citation:
Cm. Barshick, Glow discharge mass spectrometry, PRAC SPECTR, 23, 2000, pp. 31-66
Inductively coupled plasma mass spectrometry
Authors:
Olesik, JW
Citation:
Jw. Olesik, Inductively coupled plasma mass spectrometry, PRAC SPECTR, 23, 2000, pp. 67-158
Secondary ion mass spectrometry
Authors:
Cristy, SS
Citation:
Ss. Cristy, Secondary ion mass spectrometry, PRAC SPECTR, 23, 2000, pp. 159-221
Isotope dilution mass spectrometry
Authors:
Smith, DH
Citation:
Dh. Smith, Isotope dilution mass spectrometry, PRAC SPECTR, 23, 2000, pp. 223-240
The emission of ions from high-temperature condensed phase materials
Authors:
Delmore, JE
Citation:
Je. Delmore, The emission of ions from high-temperature condensed phase materials, PRAC SPECTR, 23, 2000, pp. 241-260
Analysis of nonconductive sample types by glow discharge mass spectrometry
Authors:
Marcus, RK
Citation:
Rk. Marcus, Analysis of nonconductive sample types by glow discharge mass spectrometry, PRAC SPECTR, 23, 2000, pp. 261-289
Multiple-collector inductively coupled plasma mass spectrometry
Authors:
Halliday, AN Christensen, JN Lee, DC Hall, CM Luo, XZ Rehkamper, M
Citation:
An. Halliday et al., Multiple-collector inductively coupled plasma mass spectrometry, PRAC SPECTR, 23, 2000, pp. 291-328
Ion traps and their application to elemental analysis
Authors:
Duckworth, DC Eyler, JR Watson, CH
Citation:
Dc. Duckworth et al., Ion traps and their application to elemental analysis, PRAC SPECTR, 23, 2000, pp. 329-371
Elemental speciation by inorganic mass spectrometry
Authors:
Sutton, KL Ackley, KL Caruso, JA
Citation:
Kl. Sutton et al., Elemental speciation by inorganic mass spectrometry, PRAC SPECTR, 23, 2000, pp. 373-414
Geological applications of secondary ion mass spectrometry
Authors:
Riciputi, LR
Citation:
Lr. Riciputi, Geological applications of secondary ion mass spectrometry, PRAC SPECTR, 23, 2000, pp. 415-445
Inorganic time-of-flight mass spectrometry
Authors:
Myers, DP Ray, SJ Hieftje, GM
Citation:
Dp. Myers et al., Inorganic time-of-flight mass spectrometry, PRAC SPECTR, 23, 2000, pp. 447-505
Risultati:
1-12
|