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Results: 1-25/31
Authors:
Ushakov, I
Citation: I. Ushakov, Reliability: Past, present, future, STAT IND T, 2000, pp. 3-21
Authors:
Aven, T
Citation: T. Aven, Reliability analysis as a tool for expressing and communicating uncertainty, STAT IND T, 2000, pp. 23-38
Authors:
Finkelstein, MS
Citation: Ms. Finkelstein, Modeling a process of non-ideal repair, STAT IND T, 2000, pp. 41-53
Authors:
Cocozza-Thivent, C
Citation: C. Cocozza-thivent, Some models and mathematical results for reliability of systems of components, STAT IND T, 2000, pp. 55-68
Authors:
Harlamov, B
Citation: B. Harlamov, Algorithms of stochastic activity and problems of reliability, STAT IND T, 2000, pp. 69-83
Authors:
Lillo, RE
Nanda, AK
Shaked, M
Citation: Re. Lillo et al., Some shifted stochastic orders, STAT IND T, 2000, pp. 85-103
Authors:
Klebanov, L
Szekely, G
Citation: L. Klebanov et G. Szekely, Characterization of distributions in reliability, STAT IND T, 2000, pp. 105-115
Authors:
Anisimov, VV
Citation: Vv. Anisimov, Asymptotic analysis of reliability for switching systems in light and heavy traffic conditions, STAT IND T, 2000, pp. 119-133
Authors:
Silvestrov, DS
Citation: Ds. Silvestrov, Nonlinearly perturbed Markov chains and large deviations for lifetime functionals, STAT IND T, 2000, pp. 135-144
Authors:
Korolyuk, VS
Limnios, N
Citation: Vs. Korolyuk et N. Limnios, Evolutionary systems in an asymptotic split phase space, STAT IND T, 2000, pp. 145-161
Authors:
Kolowrocki, K
Citation: K. Kolowrocki, An asymptotic approach to multistate systems reliability evaluation, STAT IND T, 2000, pp. 163-180
Authors:
Belyaev, YK
Citation: Yk. Belyaev, Computer intensive methods based on resampling in analysis of reliability and survival data, STAT IND T, 2000, pp. 183-197
Authors:
Kahle, W
Wendt, H
Citation: W. Kahle et H. Wendt, Statistical analysis of damage processes, STAT IND T, 2000, pp. 199-212
Authors:
Suzuki, K
Yamamoto, W
Karim, MR
Wang, LH
Citation: K. Suzuki et al., Data analysis based on warranty database, STAT IND T, 2000, pp. 213-227
Authors:
Wilson, SP
Citation: Sp. Wilson, Failure models indexed by time and usage, STAT IND T, 2000, pp. 229-243
Authors:
Johnson, R
Lu, WQ
Citation: R. Johnson et Wq. Lu, A new multiple proof loads approach for estimating correlations, STAT IND T, 2000, pp. 245-257
Authors:
Kurowicka, D
Cooke, R
Citation: D. Kurowicka et R. Cooke, Conditional and partial correlation for graphical uncertainty models, STAT IND T, 2000, pp. 259-276
Authors:
Duchesne, T
Citation: T. Duchesne, Semiparametric methods of time scale selection, STAT IND T, 2000, pp. 279-290
Authors:
Huber, C
Citation: C. Huber, Censored and truncated lifetime data, STAT IND T, 2000, pp. 291-305
Authors:
Crowder, M
Citation: M. Crowder, Tests for a family of survival models based on extremes, STAT IND T, 2000, pp. 307-321
Authors:
Xie, M
Citation: M. Xie, Software reliability models - Past, present and future, STAT IND T, 2000, pp. 325-340
Authors:
Lawless, JF
Citation: Jf. Lawless, Dynamic analysis of failures in repairable systems and software, STAT IND T, 2000, pp. 341-351
Authors:
Balakrishnan, N
Frattina, R
Citation: N. Balakrishnan et R. Frattina, Precedence test and maximal precedence test, STAT IND T, 2000, pp. 355-378
Authors:
Steffey, DL
Samaniego, FJ
Tran, H
Citation: Dl. Steffey et al., Hierarchical Bayesian inference in related reliability experiments, STAT IND T, 2000, pp. 379-390
Authors:
Deshpande, JV
Mukhopadhyay, M
Naik-Nimbalkar, UV
Citation: Jv. Deshpande et al., Tests for equality of intensities of failures of a repairable system undertwo competing risks, STAT IND T, 2000, pp. 391-404