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Results: 51-75/335
Authors:
Horowitz, S
Citation: S. Horowitz, Untitled, IEEE COM AP, 13(3), 2000, pp. 4
Authors:
Rao, ND
Citation: Nd. Rao, A crisis in power engineering education, IEEE COM AP, 13(3), 2000, pp. 8-8
Authors:
Gregory, D
Citation: D. Gregory, Thoughts on DNP, Modbus+, and UCA for substation use, IEEE COM AP, 13(3), 2000, pp. 10-10
Authors:
Nilsson, S
Citation: S. Nilsson, Communication system security issues, IEEE COM AP, 13(3), 2000, pp. 10-11
Authors:
Casazza, J
Citation: J. Casazza, Computers, software, and reliability, IEEE COM AP, 13(3), 2000, pp. 12-13
Authors:
Martinez, JA
Citation: Ja. Martinez, Power quality studies using electromagnetic transients programs, IEEE COM AP, 13(3), 2000, pp. 14-19
Authors:
Bernstein, R
Oristaglio, M
Miller, DE
Haldorsen, J
Citation: R. Bernstein et al., Imaging radar maps underground objects, IEEE COM AP, 13(3), 2000, pp. 20-24
Authors:
Bartak, J
Chaumes, P
Gissinger, S
Houard, J
Van Houte, U
Citation: J. Bartak et al., Operator training tools for the competitive market, IEEE COM AP, 13(3), 2000, pp. 25-31
Authors:
Agudo, ME
Young, W
Kasparek, B
Thompson, SI
Citation: Me. Agudo et al., End-to-end relay tests use secondary injection, IEEE COM AP, 13(3), 2000, pp. 32-37
Authors:
Levin, AG
McCulloch, MD
Landy, CF
Clark, AR
Citation: Ag. Levin et al., Reengineering a motor and drive simulation tool, IEEE COM AP, 13(3), 2000, pp. 38-42
Authors:
Chandrasekharan, NV
Gopi, CK
Citation: Nv. Chandrasekharan et Ck. Gopi, Design tool optimizes overhead line profiles, IEEE COM AP, 13(3), 2000, pp. 43-47
Authors:
Azevedo, GP
Feijo, B
Costa, M
Citation: Gp. Azevedo et al., Control centers evolve with agent technology, IEEE COM AP, 13(3), 2000, pp. 48-53
Authors:
Horowitz, S
Citation: S. Horowitz, From the Editor, IEEE COM AP, 13(2), 2000, pp. 4
Authors:
Criner, DE
Citation: De. Criner, A crisis in power engineering education, IEEE COM AP, 13(2), 2000, pp. 8-8
Authors:
Vassell, GS
Citation: Gs. Vassell, Reliability of electric bulk power supply in a competitive environment, IEEE COM AP, 13(2), 2000, pp. 10-11
Authors:
Lange, BH
Citation: Bh. Lange, Information superhighway, IEEE COM AP, 13(2), 2000, pp. 12
Authors:
Pereira, MVF
McCoy, MF
Merrill, HM
Citation: Mvf. Pereira et al., Managing risk in the new power business, IEEE COM AP, 13(2), 2000, pp. 18-24
Authors:
Gissinger, S
Chaumes, P
Antoine, JP
Bihain, A
Stubbe, M
Citation: S. Gissinger et al., Advanced dispatcher training simulator, IEEE COM AP, 13(2), 2000, pp. 25-30
Authors:
Apostolov, A
Vandiver, B
Citation: A. Apostolov et B. Vandiver, Automatic test system advances transformer protection, IEEE COM AP, 13(2), 2000, pp. 31-36
Authors:
Sachdev, MS
Dhakal, P
Sidhu, TS
Citation: Ms. Sachdev et al., Design tool generates substation interlock schemes, IEEE COM AP, 13(2), 2000, pp. 37-42
Authors:
Xie, XR
Liu, WH
Qian, H
Han, YD
Citation: Xr. Xie et al., Real-time supervision for STATCOM installations, IEEE COM AP, 13(2), 2000, pp. 43-47
Authors:
Sheng, SQ
Sun, YJ
Liu, Y
Zhang, WQ
Yang, YH
Citation: Sq. Sheng et al., Random adaptive optimizer restores distribution service, IEEE COM AP, 13(2), 2000, pp. 48-51
Authors:
Schavemaker, PH
van der Sluis, L
Smeets, RPP
Kertesz, V
Citation: Ph. Schavemaker et al., Digital testing of high-voltage circuit breakers, IEEE COM AP, 13(2), 2000, pp. 52-56
Authors:
Burke, J
Citation: J. Burke, Using outage data to improve reliability, IEEE COM AP, 13(2), 2000, pp. 57-60
Authors:
Horowitz, S
Citation: S. Horowitz, From the editor, IEEE COM AP, 13(1), 2000, pp. 4