Authors: ALASAAD H HAYES JP MURRAY BT

Citation: H. Alasaad et al., SCALABLE TEST GENERATORS FOR HIGH-SPEED DATAPATH CIRCUITS, JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 12(1-2), 1998, pp. 111-125

Authors: ALASAAD H MURRAY BT HAYES JP

Citation: H. Alasaad et al., ONLINE BIST FOR EMBEDDED SYSTEMS, IEEE design & test of computers, 15(4), 1998, pp. 17-24