Authors: DASGUPTA A MAGRAB EB ANAND DK EISINGER K MCLEISH JG TORRES MA LALL P DISHONGH TJ

Citation: A. Dasgupta et al., PERSPECTIVES TO UNDERSTAND RISKS HN THE ELECTRONIC INDUSTRY, IEEE transactions on components, packaging, and manufacturing technology. Part A, 20(4), 1997, pp. 542-547

Authors: KUMAR B ANAND DK ANJANAPPA M KIRK JA

Citation: B. Kumar et al., FEATURE-EXTRACTION AND VALIDATION WITHIN A FLEXIBLE MANUFACTURING PROTOCOL, Knowledge-based systems, 6(3), 1993, pp. 130-140