Authors: TORRISI A LICCIARDELLO A ANCARANI V CANTIANO M PUGLISI O

Citation: A. Torrisi et al., ION VERSUS NEUTRAL IRRADIATION OF THIN-FILMS OF AMORPHOUS SIO2 - AN IN-SITU X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 116(1-4), 1996, pp. 342-346