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Results:
1-15
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Results: 15
Authors:
LAIDANI N
SPERANZA G
NEFEDOV A
CALLIARI L
ANDERLE M
Citation: N. Laidani et al., CHARACTERIZATION OF CARBON AND ZIRCONIA FILMS DEPOSITED ON POLYCARBONATE FOR SCRATCH-PROOF COATING APPLICATIONS, DIAMOND AND RELATED MATERIALS, 7(9), 1998, pp. 1394-1402
Authors:
DEMARTINO C
FUSCO G
MINA G
TAGLIAFERRO A
VANZETTI L
CALLIARI L
ANDERLE M
Citation: C. Demartino et al., IMPROVEMENT OF MECHANICAL-PROPERTIES OF A-C-H BY SILICON ADDITION, DIAMOND AND RELATED MATERIALS, 6(5-7), 1997, pp. 559-563
Authors:
ANDERLE M
Citation: M. Anderle, CYCLIC COMPOSITIONAL PATTERNS IN TRAKL,GEORG POETRY - GERMAN - CSURI,K, Colloquia germanica, 30(3), 1997, pp. 296-298
Authors:
KLECHKOVSKAYA V
ANDERLE M
ANTOLINI R
CANTERI R
FEIGIN L
RAKOVA E
STIOPINA N
Citation: V. Klechkovskaya et al., COMPARATIVE-ANALYSIS OF HIGH-ENERGY ELECTRON-DIFFRACTION PATTERNS FROM LB FILMS OF CD-STEARATE AND PB-STEARATE, Thin solid films, 285, 1996, pp. 208-210
Authors:
DORIGONI L
PAVESI L
BISI O
CALLIARI L
ANDERLE M
OSSICINI S
Citation: L. Dorigoni et al., AUGER LINESHAPE ANALYSIS OF POROUS SILICON - EXPERIMENT AND THEORY, Thin solid films, 276(1-2), 1996, pp. 244-247
Authors:
SHAREEF IA
RUBLOFF GW
ANDERLE M
GILL WN
COTTE J
KIM DH
Citation: Ia. Shareef et al., SUBATMOSPHERIC CHEMICAL-VAPOR-DEPOSITION OZONE TEOS PROCESS FOR SIO2 TRENCH FILLING/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(4), 1995, pp. 1888-1892
Authors:
TEDDER LL
RUBLOFF GW
SHAREEF I
ANDERLE M
KIM DH
PARSONS GN
Citation: Ll. Tedder et al., REAL-TIME PROCESS AND PRODUCT DIAGNOSTICS IN RAPID THERMAL CHEMICAL-VAPOR-DEPOSITION USING IN-SITU MASS-SPECTROMETRIC SAMPLING, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(4), 1995, pp. 1924-1927
Authors:
ANDERLE M
COLUZZA C
MARGARITONDO G
SANCROTTI M
Citation: M. Anderle et al., UNTITLED - FOREWORD, Surface review and letters, 2(6), 1995, pp. 807-807
Authors:
ANDERLE M
COLUZZA C
MARGARITONDO G
SANCROTTI M
Citation: M. Anderle et al., FOREWORD, Surface review and letters, 2(5), 1995, pp. 589-589
Authors:
ANDERLE M
SCHWENG H
KURTEN KE
KRATKY KW
Citation: M. Anderle et al., PATTERN-SPECIFIC NEURAL-NETWORK DESIGN, Journal of statistical physics, 81(3-4), 1995, pp. 843-849
Authors:
ANDERLE M
LAZZERI P
MORO L
BENETTI P
ROSSELLA M
QUEIROLO G
Citation: M. Anderle et al., INVESTIGATION ON LASER-ABLATION OF INGAAS BY MEANS OF RESONANCE IONIZATION AND SURFACES ANALYSIS SPECTROMETRIES, Spectrochimica acta, Part B: Atomic spectroscopy, 49(12-14), 1994, pp. 1453-1462
Authors:
SZELES C
NIELSEN B
ASOKAKUMAR P
LYNN KG
ANDERLE M
MA TP
RUBLOFF GW
Citation: C. Szeles et al., ROLE OF IMPLANTATION-INDUCED DEFECTS IN SURFACE-ORIENTED DIFFUSION OFFLUORINE IN SILICON, Journal of applied physics, 76(6), 1994, pp. 3403-3409
Authors:
PAVESI L
CESCHINI M
MARIOTTO G
ZANGHELLINI E
BISI O
ANDERLE M
CALLIARI L
FEDRIZZI M
FEDRIZZI L
Citation: L. Pavesi et al., SPECTROSCOPIC INVESTIGATION OF ELECTROLUMINESCENT POROUS SILICON, Journal of applied physics, 75(2), 1994, pp. 1118-1126
Authors:
CALLIARI L
ANDERLE M
CESCHINI M
PAVESI L
MARIOTTO G
BISI O
Citation: L. Calliari et al., ELECTRON-BOMBARDMENT EFFECTS ON LIGHT-EMITTING POROUS SILICON, Journal of luminescence, 57(1-6), 1993, pp. 83-87
Authors:
DANA SS
ANDERLE M
RUBLOFF GW
ACOVIC A
Citation: Ss. Dana et al., CHEMICAL-VAPOR-DEPOSITION OF ROUGH-MORPHOLOGY SILICON FILMS OVER A BROAD TEMPERATURE-RANGE, Applied physics letters, 63(10), 1993, pp. 1387-1389
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