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Results: 1-3 |
Results: 3
SELECTING FOR COMMON BACTERIAL-BLIGHT RESISTANCE IN COMMON BEAN - EFFECTS OF MULTIPLE LEAF INOCULATION AND DETACHED POD INOCULATION TEST
Authors: ARIYARATHNE HM COYNE DP VIDAVER AK ESKRIDGE KM
Citation: Hm. Ariyarathne et al., SELECTING FOR COMMON BACTERIAL-BLIGHT RESISTANCE IN COMMON BEAN - EFFECTS OF MULTIPLE LEAF INOCULATION AND DETACHED POD INOCULATION TEST, Journal of the American Society for Horticultural Science, 123(5), 1998, pp. 864-867
MOLECULAR-MARKER-BASED GENETIC-ANALYSIS OF TEPARY BEAN-DERIVED COMMONBACTERIAL-BLIGHT RESISTANCE IN DIFFERENT DEVELOPMENTAL STAGES OF COMMON BEAN
Authors: JUNG G SKROCH PW COYNE DP NIENHUIS J ARNAUDSANTANA E ARIYARATHNE HM KAEPPLER SM BASSETT MJ
Citation: G. Jung et al., MOLECULAR-MARKER-BASED GENETIC-ANALYSIS OF TEPARY BEAN-DERIVED COMMONBACTERIAL-BLIGHT RESISTANCE IN DIFFERENT DEVELOPMENTAL STAGES OF COMMON BEAN, Journal of the American Society for Horticultural Science, 122(3), 1997, pp. 329-337
MOLECULAR MARKERS ASSOCIATED WITH PLANT ARCHITECTURE AND RESISTANCE TO COMMON BLIGHT, WEB BLIGHT, AND RUST IN COMMON BEANS
Authors: JUNG GW COYNE DP SKROCH PW NIENHUIS J ARNAUDSANTANA E BOKOSI J ARIYARATHNE HM STEADMAN JR BEAVER JS KAEPPLER SM
Citation: Gw. Jung et al., MOLECULAR MARKERS ASSOCIATED WITH PLANT ARCHITECTURE AND RESISTANCE TO COMMON BLIGHT, WEB BLIGHT, AND RUST IN COMMON BEANS, Journal of the American Society for Horticultural Science, 121(5), 1996, pp. 794-803
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