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Results:
1-14
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Results: 14
Authors:
JOSEPH B
BARBIER F
DAGOURY G
AUCOUTURIER M
Citation: B. Joseph et al., RAPID PENETRATION OF LIQUID BI ALONG CU GRAIN-BOUNDARIES, Scripta materialia, 39(6), 1998, pp. 775-781
Authors:
CASTAING J
AUCOUTURIER M
Citation: J. Castaing et M. Aucouturier, MATERIALS SCIENCE IN FRANCE - A TRIBUTE TO PHILIBERT,JEAN - FOREWORD, Journal de physique. III, 5(11), 1995, pp. 6-6
Authors:
DARQUECERETTI E
AUCOUTURIER M
Citation: E. Darqueceretti et M. Aucouturier, SURFACE AND INTERFACE ANALYSIS IN MATERIALS SCIENCE - METHOD SELECTION, DIFFICULTIES AND APPLICATIONS, Analusis, 23(2), 1995, pp. 49-58
Authors:
DARQUECERETTI E
DECHALENDARBAUDOUX B
AUCOUTURIER M
Citation: E. Darqueceretti et al., ABOUT THE PREVISION OF THE INITIAL ADHESION AND LONG-TERM STEADINESS OF SILICONE ADHESIVE JOINTS, Le Vide, les couches minces, (272), 1994, pp. 565-568
Authors:
DEMIERRY P
ETCHEBERRY A
RIZK R
ETCHEGOIN P
AUCOUTURIER M
Citation: P. Demierry et al., DEFECTS INDUCED IN P-TYPE SILICON BY PHOTOCATHODIC CHARGING OF HYDROGEN, Journal of the Electrochemical Society, 141(6), 1994, pp. 1539-1546
Authors:
DECHALENDARBAUDOUX B
AUCOUTURIER M
MARECHAL JC
Citation: B. Dechalendarbaudoux et al., STUDY ON THE AGING OF SILICON ADHESIVE JO INTS, Le Vide, (268), 1993, pp. 140-142
Authors:
DECHALENDARBAUDOUX B
PASCAL J
BLANVILLAIN E
DARQUECERETTI E
AUCOUTURIER M
Citation: B. Dechalendarbaudoux et al., MEASUREMENT OF THE MOLDING ANGLES FOR CHA RACTERIZATION OF SURFACES FOR ADHESION - CRITICAL ANALYSIS OF METHODS AND RESULTS, Le Vide, (268), 1993, pp. 198-200
Authors:
AUCOUTURIER M
GRATTEPAIN C
TROMSONCARLI A
BARBE M
COHENSOLAL G
MARFAING Y
CHEVRIER F
LEGALL H
IMHOFF D
Citation: M. Aucouturier et al., ANALYSIS OF SINGLE-LAYERED OR MULTILAYERE D MATERIALS BY SIMS (SECONDARY-ION MASS-SPECTROMETRY) - INTERPRETATION OF THE INTERFACE PROFILE, Journal de physique. IV, 3(C7), 1993, pp. 803-806
Authors:
RIZK R
THEYS B
PESANT JC
CHEVALLIER J
AUCOUTURIER M
PAJOT B
Citation: R. Rizk et al., DEUTERIUM EFFUSION FROM CRYSTALLINE N-TYPE GAAS(SI), Physical review. B, Condensed matter, 47(23), 1993, pp. 15523-15532
Authors:
KURBATOV G
DARQUECERETTI E
AUCOUTURIER M
Citation: G. Kurbatov et al., XPS STUDY OF HYDROXYLATED OXIDE LAYER FORMATION ON PURE IRON AND THEIR ACID-BASE PROPERTIES, Surface and interface analysis, 20(5), 1993, pp. 402-406
Authors:
CASAMASSIMA M
DARQUECERETTI E
ETCHEBERRY A
AUCOUTURIER M
Citation: M. Casamassima et al., CORRELATION BETWEEN LEWIS DONOR-ACCEPTOR PROPERTIES DETERMINED BY XPSAND BRONSTED ACID-BASE PROPERTIES DETERMINED BY REST-POTENTIAL MEASUREMENTS, FOR ALUMINUM AND SILICON-OXIDES, Journal of Materials Science, 28(15), 1993, pp. 3997-4002
Authors:
AUCOUTURIER M
Citation: M. Aucouturier, PASTERNAK,BORIS AND THE REVOLUTION, Europe-Revue littéraire mensuelle, 71(767), 1993, pp. 27-47
Authors:
AUCOUTURIER M
Citation: M. Aucouturier, CORRESPONDENCE BETWEEN PASTERNAK,BORIS AND ROLLAND,ROMAIN 1930, Europe-Revue littéraire mensuelle, 71(767), 1993, pp. 104-118
Authors:
DARQUECERETTI E
AUCOUTURIER M
BOUTRYFORVEILLE A
Citation: E. Darqueceretti et al., INVESTIGATION OF SPUTTER-INDUCED SURFACE-COMPOSITION MODIFICATION DURING IN-DEPTH PROFILING OF IMPLANTED MATERIALS BY SIMS, XPS AND AES, Surface and interface analysis, 18(3), 1992, pp. 229-239
Risultati:
1-14
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