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Reliability considerations of III-nitride microelectronic devices
Authors:
Wurfl, J Abrosimova, V Hilsenbeck, J Nebauer, E Rieger, W Trankle, G
Citation:
J. Wurfl et al., Reliability considerations of III-nitride microelectronic devices, MICROEL REL, 39(12), 1999, pp. 1737-1757
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