Authors:
Edelman, F
Hahn, H
Seifried, S
Alof, C
Hoche, H
Balogh, A
Werner, P
Zakrzewska, K
Radecka, M
Pasierb, P
Chack, A
Mikhelashvili, V
Eisenstein, G
Citation: F. Edelman et al., Structural evolution of SnO2-TiO2 nanocrystalline films for gas sensors, MAT SCI E B, 69, 2000, pp. 386-391
Citation: C. Alof et al., Interface contribution to giant magnetoresistance in granular AgFe studiedwith Mossbauer spectroscopy, J APPL PHYS, 88(7), 2000, pp. 4212-4215
Authors:
Heitmann, S
Hutten, A
Hempel, T
Schepper, W
Reiss, G
Alof, C
Citation: S. Heitmann et al., Interplay of antiferromagnetic coupling in copper/permalloy combination multilayers, J APPL PHYS, 87(9), 2000, pp. 4849-4851