Authors:
Rizzo, A
Tagliente, MA
Alvisi, M
Scaglione, S
Citation: A. Rizzo et al., Structural and optical properties of silver thin films deposited by RF magnetron sputtering, THIN SOL FI, 396(1-2), 2001, pp. 29-35
Authors:
Alvisi, M
De Tomasi, F
Perrone, MR
Protopapa, ML
Rizzo, A
Sarto, F
Scaglione, S
Citation: M. Alvisi et al., Laser damage dependence on structural and optical properties of ion-assisted HfO2 thin films, THIN SOL FI, 396(1-2), 2001, pp. 44-52
Authors:
Curri, ML
Leo, G
Alvisi, M
Agostiano, A
Della Monica, M
Vasanelli, L
Citation: Ml. Curri et al., CdS nanocrystals from a quaternary water-in-oil microemulsion: Preparationand characterization of self-assembled layers, J COLL I SC, 243(1), 2001, pp. 165-170
Authors:
Alvisi, M
Mirenghi, L
Tapfer, L
Rizzo, A
Ferrara, MC
Scaglione, S
Vasanelli, L
Citation: M. Alvisi et al., Structural and chemical investigation of surface and interface of multilayer optical coatings deposited by DIBS, APPL SURF S, 157(1-2), 2000, pp. 52-60
Authors:
Alvisi, M
Scaglione, S
Martelli, S
Rizzo, A
Vasanelli, L
Citation: M. Alvisi et al., Structural and optical modification in hafnium oxide thin films related tothe momentum parameter transferred by ion beam assistance, THIN SOL FI, 354(1-2), 1999, pp. 19-23
Authors:
Alvisi, M
De Nunzio, G
Perrone, MR
Rizzo, A
Scaglione, S
Vasanelli, L
Citation: M. Alvisi et al., Influence of the assisting-ion-beam parameters on the laser-damage threshold of SiO2 films, THIN SOL FI, 338(1-2), 1999, pp. 269-275
Authors:
Alvisi, M
De Nunzio, G
Di Giulio, M
Ferrara, MC
Perrone, MR
Protopapa, L
Vasanelli, L
Citation: M. Alvisi et al., Deposition of SiO2 films with high laser damage thresholds by ion-assistedelectron-beam evaporation, APPL OPTICS, 38(7), 1999, pp. 1237-1243