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Results: 26-50/51
Authors:
Deb, PK
Amos, K
Karataglidis, S
Citation: Pk. Deb et al., Microscopic model analyses of the elastic scattering of 25, 30 and 40 MeV protons from targets of diverse mass, AUST J PHYS, 53(6), 2000, pp. 767-784
Authors:
Karataglidis, S
Dortmans, PJ
Amos, K
Citation: S. Karataglidis et al., Comment on "Energy dependence of the NN t matrix in the optical potential for elastic nucleon-nucleus scattering", PHYS REV C, 59(3), 1999, pp. 1813-1815
Authors:
Amos, K
Citation: K. Amos, Profibus seeks worldwide dominance, INTECH, 1999, pp. 16-18
Authors:
Amos, K
Citation: K. Amos, Intrinsic safety offers more, gives peace of mind, INTECH, 46(9), 1999, pp. 166
Authors:
Amos, K
Citation: K. Amos, The IEC dictates single standard ... but will they?, INTECH, 46(9), 1999, pp. 177-177
Authors:
Amos, K
Citation: K. Amos, IEC seeks peace, wants 61158 effective by year 2000, INTECH, 46(8), 1999, pp. 17-17
Authors:
Amos, K
Citation: K. Amos, New smart temperature device melts the mold, INTECH, 46(7), 1999, pp. 62-62
Authors:
Amos, K
Citation: K. Amos, Will small and medium manufacturers be ready for 2000?, INTECH, 46(6), 1999, pp. 21-21
Authors:
Amos, K
Citation: K. Amos, Sensor market goes global, INTECH, 46(6), 1999, pp. 40-43
Authors:
Amos, K
Citation: K. Amos, Open systems, standards stir new industry revolution, INTECH, 46(5), 1999, pp. 18-18
Authors:
Amos, K
Citation: K. Amos, CEMS: Costly compliance tools, INTECH, 46(5), 1999, pp. 57-60
Authors:
Amos, K
Citation: K. Amos, Stop Ka-BOOM!, INTECH, 46(5), 1999, pp. 119-122
Authors:
Amos, K
Citation: K. Amos, Siemens calls fieldbuses fray puzzling, technical, emotional, INTECH, 46(5), 1999, pp. 132-132
Authors:
Amos, K
Citation: K. Amos, Alliance spawns water research, INTECH, 46(3), 1999, pp. 18-18
Authors:
Amos, K
Citation: K. Amos, Embeddeds are Cargill Y2K targets, INTECH, 46(2), 1999, pp. 53
Authors:
Amos, K
Sheble, N
Citation: K. Amos et N. Sheble, Industry looks to the future, INTECH, 46(12), 1999, pp. 40-47
Authors:
Amos, K
Citation: K. Amos, Panama Canal remains 'world's greatest engineering project', INTECH, 46(12), 1999, pp. 54-55
Authors:
Amos, K
Citation: K. Amos, Inside or outside, users always need an edge, INTECH, 46(12), 1999, pp. 56
Authors:
Amos, K
Citation: K. Amos, World vs. USA: What will be global process-safety standard?, INTECH, 46(11), 1999, pp. 34-35
Authors:
Amos, K
Citation: K. Amos, Eight-part IEC 61158 ballot begins this month, INTECH, 46(10), 1999, pp. 37-38
Authors:
Amos, K
Citation: K. Amos, Leakless vapor-space valve controls unveiled, INTECH, 46(1), 1999, pp. 22-24
Authors:
Amos, K
Citation: K. Amos, SP84 chair sees self-testing as safety benefit, INTECH, 46(1), 1999, pp. 35-35
Authors:
Amos, K
Citation: K. Amos, 1999 outlook: From the control room to the field, INTECH, 46(1), 1999, pp. 38-45
Authors:
Lun, DR
Eberspacher, M
Amos, K
Scheid, W
Buckman, SJ
Citation: Dr. Lun et al., Improved spin-orbit inversion method, PHYS REV A, 58(6), 1998, pp. 4993-4996
Authors:
Amos, K
Citation: K. Amos, Y2K draws products to ISA EXPO/98, INTECH, 45(12), 1998, pp. 26-27