Authors:
Schwartzkopf, LA
Jiang, J
Cai, XY
Apodaca, D
Larbalestier, DC
Citation: La. Schwartzkopf et al., The use of the in-field critical current density, J(c)(0.1 T), as a betterdescriptor of (Bi, Pb)(2)Sr2Ca2Cu3Ox/Ag tape performance, APPL PHYS L, 75(20), 1999, pp. 3168-3170