Authors: Golan, G Axelevitch, A Rabinovitch, E

Citation: G. Golan et al., Effects of electron beam generated in vacuum photo-thermal processing on metal-silicon contacts, MICROEL REL, 41(6), 2001, pp. 871-879

Authors: Golan, G Rabinovich, E Inberg, A Axelevitch, A Lubarsky, G Rancoita, PG Demarchi, M Seidman, A Croitoru, N

Citation: G. Golan et al., Inversion phenomenon as a result of junction damages in neutron irradiatedsilicon detectors, MICROEL REL, 41(1), 2001, pp. 67-72

Authors: Golan, G Axelevitch, A Margolin, R Rabinovitch, E

Citation: G. Golan et al., Novel approach to sputtered tantalum film resistors with controlled pre-defined resistance, MICROELEC J, 32(1), 2001, pp. 61-67

Authors: Golan, G Axelevitch, A

Citation: G. Golan et A. Axelevitch, Novel sputtering method for Pd-Al2O3UV transparent conductive coatings, MICROELEC J, 31(6), 2000, pp. 469-473

Authors: Golan, G Rabinovich, E Inberg, A Axelevitch, A Oksman, M Rosenwaks, Y Kozlovsky, A Rancoita, PG Rattaggi, M Seidman, A Croitoru, N

Citation: G. Golan et al., Dislocations structure investigation in neutron irradiated silicon detectors using AFM and microhardness measurements, MICROEL REL, 39(10), 1999, pp. 1497-1504