Authors: BANET MJ FUCHS M ROGERS JA REINOLD JH KNECHT JM ROTHSCHILD M LOGAN R MAZNEV AA NELSON KA

Citation: Mj. Banet et al., HIGH-PRECISION FILM THICKNESS DETERMINATION USING A LASER-BASED ULTRASONIC TECHNIQUE, Applied physics letters, 73(2), 1998, pp. 169-171

Authors: ROGERS JA FUCHS M BANET MJ HANSELMAN JB LOGAN R NELSON KA

Citation: Ja. Rogers et al., OPTICAL-SYSTEM FOR RAPID MATERIALS CHARACTERIZATION WITH THE TRANSIENT GRATING TECHNIQUE - APPLICATION TO NONDESTRUCTIVE EVALUATION OF THIN-FILMS USED IN MICROELECTRONICS, Applied physics letters, 71(2), 1997, pp. 225-227