Authors: ALMOND DP BARKER AK BENTO AC SINGH SK APPLEYARD NJ JACKSON TJ PALMER SB

Citation: Dp. Almond et al., HIGH-TEMPERATURE SUPERCONDUCTOR THIN-FILM CHARACTERIZATION BY THE MODULATED OPTICAL REFLECTANCE TECHNIQUE, Superconductor science and technology, 8(8), 1995, pp. 667-672