Citation: J. Bastos et al., MISMATCH CHARACTERIZATION OF SUBMICRON MOS-TRANSISTORS, Analog integrated circuits and signal processing, 12(2), 1997, pp. 95-106
Authors:
BASTOS J
STEYAERT MSJ
PERGOOT A
SANSEN WM
Citation: J. Bastos et al., INFLUENCE OF DIE ATTACHMENT ON MOS-TRANSISTOR MATCHING, IEEE transactions on semiconductor manufacturing, 10(2), 1997, pp. 209-218