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Results: 1-7 |
Results: 7

Authors: BENKABOU F BECKER JP CERTIER M AOURAG H
Citation: F. Benkabou et al., CALCULATION OF ELECTRONIC AND OPTICAL-PROPERTIES OF ZINC BLENDE GAP1-XNX, Superlattices and microstructures, 23(2), 1998, pp. 453-465

Authors: VANTOMME A MAHAN JE LANGOUCHE G BECKER JP VANBAEL M TEMST K VANHAESENDONCK C
Citation: A. Vantomme et al., THIN-FILM GROWTH OF SEMICONDUCTING MG2SI BY CODEPOSITION, Applied physics letters, 70(9), 1997, pp. 1086-1088

Authors: MAHAN JE VANTOMME A LANGOUCHE G BECKER JP
Citation: Je. Mahan et al., SEMICONDUCTING MG2SI THIN-FILMS PREPARED BY MOLECULAR-BEAM EPITAXY, Physical review. B, Condensed matter, 54(23), 1996, pp. 16965-16971

Authors: BECKER JP MAHAN JE LONG RG
Citation: Jp. Becker et al., RESI2 THIN-FILM INFRARED DETECTORS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(3), 1995, pp. 1133-1135

Authors: LONG RG BECKER JP MAHAN JE VANTOMME A NICOLET MA
Citation: Rg. Long et al., HETEROEPITAXIAL RELATIONSHIPS FOR CRSI2 THIN-FILMS ON SI(111), Journal of applied physics, 77(7), 1995, pp. 3088-3094

Authors: LONG RG BECKER JP MAHAN JE
Citation: Rg. Long et al., INFRARED DETECTION WITH A RESI2 THIN-FILM PHOTORESISTOR, Applied physics letters, 66(7), 1995, pp. 875-876

Authors: BECKER JP LONG RG MAHAN JE
Citation: Jp. Becker et al., REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION PATTERNS OF CARBIDE-CONTAMINATED SILICON SURFACES, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(1), 1994, pp. 174-178
Risultati: 1-7 |