Authors: BELBOUNAGUIA N DRUON C TABOURIER P WACRENIER JM

Citation: N. Belbounaguia et al., NONDESTRUCTIVE MAPPING OF GAAS WAFERS FROM MEASUREMENT OF MAGNETORESISTANCE EFFECT USING A NOVEL MICROWAVE DEVICE, IEEE transactions on instrumentation and measurement, 43(1), 1994, pp. 24-29

Authors: DRUON C BELBOUNAGUIA N TABOURIER P WACRENIER JM

Citation: C. Druon et al., MICROWAVE DEVICE FOR NONDESTRUCTIVE MAGNETORESISTANCE MEASUREMENT OF SEMICONDUCTING LAYERS, Materials science & engineering. B, Solid-state materials for advanced technology, 20(1-2), 1993, pp. 203-206