Authors: ILTGEN K BENDEL C BENNINGHOVEN A NIEHUIS E

Citation: K. Iltgen et al., OPTIMIZED TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROSCOPY DEPTH PROFILING WITH A DUAL-BEAM TECHNIQUE, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(3), 1997, pp. 460-464

Authors: CHRYSSOULIS SL STOWE KG NIEHUIS E CRAMER HG BENDEL C KIM JY

Citation: Sl. Chryssoulis et al., DETECTION OF COLLECTORS ON CONCENTRATOR MINERAL GRAINS BY TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY (TOF-SIMS), Transactions - Institution of Mining and Metallurgy. Section C. Mineral processing & extractive metallurgy, 104, 1995, pp. 141-150

Authors: MEINKE M TAO N BENDEL C STSAUVER J HOSTETTER M

Citation: M. Meinke et al., CLONING OF CANDIDA-ALBICANS DNA ENCODING AN INTEGRIN ANALOG, Pediatric research, 35(4), 1994, pp. 10000187-10000187

Authors: CARLSON S HOSTETTER M FINKEL D BENDEL C

Citation: S. Carlson et al., GENOTYPIC AND FUNCTIONAL-ANALYSIS OF CANDIDA-ALBICANS STRAINS FROM MOTHER-INFANT PAIRS, Pediatric research, 35(4), 1994, pp. 10000295-10000295