Authors: FISCHER D MEISSNER O BENDJUS B SCHREIBER J STAVREV M WENZEL C

Citation: D. Fischer et al., AFM CHARACTERIZATION OF TA-BASED DIFFUSION-BARRIERS FOR USE IN FUTURESEMICONDUCTOR METALLIZATION, Surface and interface analysis, 25(7-8), 1997, pp. 522-528

Authors: BENDJUS B FIEDLER H

Citation: B. Bendjus et H. Fiedler, EVALUATING DIFFERENT ROUTES OF PREPARATIO N FOR CUTTING TOOLS MADE OFHIGH-SPEED STEEL, Stahl und Eisen, 115(11), 1995, pp. 97