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Results: 1-9 |
Results: 9
AL TIXW1-X METAL/DIFFUSION-BARRIER BILAYERS - INTERFACIAL REACTION PATHWAYS AND KINETICS DURING ANNEALING/
Authors: BERGSTROM DB PETROV I GREENE JE
Citation: Db. Bergstrom et al., AL TIXW1-X METAL/DIFFUSION-BARRIER BILAYERS - INTERFACIAL REACTION PATHWAYS AND KINETICS DURING ANNEALING/, Journal of applied physics, 82(5), 1997, pp. 2312-2322
ALUMINIDE FORMATION IN POLYCRYSTALLINE AL W METAL/BARRIER THIN-FILM BILAYERS - REACTION PATHS AND KINETICS/
Authors: BERGSTROM DB PETROV I ALLEN LH GREENE JE
Citation: Db. Bergstrom et al., ALUMINIDE FORMATION IN POLYCRYSTALLINE AL W METAL/BARRIER THIN-FILM BILAYERS - REACTION PATHS AND KINETICS/, Journal of applied physics, 82(1), 1997, pp. 201-209
MORPHOLOGY AND MICROSTRUCTURE OF EPITAXIAL CU(001) FILMS GROWN BY PRIMARY ION DEPOSITION ON SI AND GE SUBSTRATES
Authors: KARR BW KIM YW PETROV I BERGSTROM DB CAHILL DG GREENE JE MADSEN LD SUNDGREN JE
Citation: Bw. Karr et al., MORPHOLOGY AND MICROSTRUCTURE OF EPITAXIAL CU(001) FILMS GROWN BY PRIMARY ION DEPOSITION ON SI AND GE SUBSTRATES, Journal of applied physics, 80(12), 1996, pp. 6699-6705
HIGH-FLUX LOW-ENERGY (SIMILAR-OR-EQUAL-TO-20 EV) N-2(- EFFECTS ON MICROSTRUCTURE AND PREFERRED ORIENTATION() ION IRRADIATION DURING TIN DEPOSITION BY REACTIVE MAGNETRON SPUTTERING )
Authors: HULTMAN L SUNDGREN JE GREENE JE BERGSTROM DB PETROV I
Citation: L. Hultman et al., HIGH-FLUX LOW-ENERGY (SIMILAR-OR-EQUAL-TO-20 EV) N-2(- EFFECTS ON MICROSTRUCTURE AND PREFERRED ORIENTATION() ION IRRADIATION DURING TIN DEPOSITION BY REACTIVE MAGNETRON SPUTTERING ), Journal of applied physics, 78(9), 1995, pp. 5395-5403
REACTION PATHS AND KINETICS OF ALUMINIDE FORMATION IN AL EPITAXIAL-W(001) MODEL DIFFUSION BARRIER SYSTEMS/
Authors: BERGSTROM DB PETROV I ALLEN LH GREENE JE
Citation: Db. Bergstrom et al., REACTION PATHS AND KINETICS OF ALUMINIDE FORMATION IN AL EPITAXIAL-W(001) MODEL DIFFUSION BARRIER SYSTEMS/, Journal of applied physics, 78(1), 1995, pp. 194-203
ORIGIN OF COMPOSITIONAL VARIATIONS IN SPUTTER-DEPOSITED TIXW1-X DIFFUSION BARRIER LAYERS
Authors: BERGSTROM DB TIAN F PETROV I MOSER J GREENE JE
Citation: Db. Bergstrom et al., ORIGIN OF COMPOSITIONAL VARIATIONS IN SPUTTER-DEPOSITED TIXW1-X DIFFUSION BARRIER LAYERS, Applied physics letters, 67(21), 1995, pp. 3102-3104
DEVELOPMENT OF PREFERRED ORIENTATION IN POLYCRYSTALLINE TIN LAYERS GROWN BY ULTRAHIGH-VACUUM REACTIVE MAGNETRON SPUTTERING
Authors: GREENE JE SUNDGREN JE HULTMAN L PETROV I BERGSTROM DB
Citation: Je. Greene et al., DEVELOPMENT OF PREFERRED ORIENTATION IN POLYCRYSTALLINE TIN LAYERS GROWN BY ULTRAHIGH-VACUUM REACTIVE MAGNETRON SPUTTERING, Applied physics letters, 67(20), 1995, pp. 2928-2930
SINGLE-PHASE POLYCRYSTALLINE TI1-XWXN ALLOYS LESS-THAN-OR-EQUAL-TO-X-LESS-THAN-OR-EQUAL-TO-0.7) GROWN BY UHV REACTIVE MAGNETRON SPUTTERING - MICROSTRUCTURE AND PHYSICAL-PROPERTIES
Authors: MOSER JH TIAN F HALLER O BERGSTROM DB PETROV I GREENE JE WIEMER C
Citation: Jh. Moser et al., SINGLE-PHASE POLYCRYSTALLINE TI1-XWXN ALLOYS LESS-THAN-OR-EQUAL-TO-X-LESS-THAN-OR-EQUAL-TO-0.7) GROWN BY UHV REACTIVE MAGNETRON SPUTTERING - MICROSTRUCTURE AND PHYSICAL-PROPERTIES, Thin solid films, 253(1-2), 1994, pp. 445-450
ELEMENTARY DIFFUSIVE DISPLACEMENTS OF MODIFIER CATIONS IN NETWORK STRUCTURES
Authors: MANALANG MA BERGSTROM DB KRAMER DE KIEFFER J
Citation: Ma. Manalang et al., ELEMENTARY DIFFUSIVE DISPLACEMENTS OF MODIFIER CATIONS IN NETWORK STRUCTURES, Journal of non-crystalline solids, 169(1-2), 1994, pp. 72-86
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