Authors: WANG YC ADAMS SG THORP JS MACDONALD NC HARTWELL P BERTSCH F

Citation: Yc. Wang et al., CHAOS IN MEMS, PARAMETER-ESTIMATION AND ITS POTENTIAL APPLICATION, IEEE transactions on circuits and systems. 1, Fundamental theory andapplications, 45(10), 1998, pp. 1013-1020

Authors: BERTSCH F MATTNER J STEHLING MK MULLERLISSE U PELLER M LOEFFLER R WEBER J MESSMER K WILMANNS W ISSELS R REISER M

Citation: F. Bertsch et al., NONINVASIVE TEMPERATURE MAPPING USING MRI - COMPARISON OF 2 METHODS BASED ON CHEMICAL-SHIFT AND T-1-RELAXATION, Magnetic resonance imaging, 16(4), 1998, pp. 393-403

Authors: STEHLING MK BERTSCH F MATTNER J PELLER M FABER S WEBER J

Citation: Mk. Stehling et al., PRECISE NONINVASIVE TEMPERATURE MONITORING WITH T1 AND CHEMICAL-SHIFTMETHODS, Radiology, 201, 1996, pp. 1416-1416

Authors: BEK F BERTSCH F WITT K

Citation: F. Bek et al., HP CE SEPARATION CONTROL ELECTRONICS AND FIRMWARE, HEWLETT-PAC, 46(3), 1995, pp. 36-43