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Results: 1-19 |
Results: 19
MODELIZATION AND CHARACTERIZATION OF AU INSB/INP SCHOTTKY SYSTEMS AS A FUNCTION OF TEMPERATURE/
Authors: AKKAL B BENAMARA Z BOUDISSA A BOUIADJRA NB AMRANI M BIDEUX L GRUZZA B
Citation: B. Akkal et al., MODELIZATION AND CHARACTERIZATION OF AU INSB/INP SCHOTTKY SYSTEMS AS A FUNCTION OF TEMPERATURE/, Materials science & engineering. B, Solid-state materials for advanced technology, 55(3), 1998, pp. 162-168
A MONTE-CARLO STUDY FOR ELECTRON ELASTIC BACKSCATTERING BASED ON LAYERED MODELS FOR SUBSTRATES
Authors: ROBERT C GRUZZA B BIDEUX L BONDOT P
Citation: C. Robert et al., A MONTE-CARLO STUDY FOR ELECTRON ELASTIC BACKSCATTERING BASED ON LAYERED MODELS FOR SUBSTRATES, Mathematics and computers in simulation, 47(2-5), 1998, pp. 419-427
PASSIVATION OF III-IV COMPOUNDS USED FOR METAL-INSULATOR-INP(100) STRUCTURES
Authors: BIDEUX L MERLE S ROBERT C GRUZZA B BENAMARRA Z TIZI S CHELLALI M
Citation: L. Bideux et al., PASSIVATION OF III-IV COMPOUNDS USED FOR METAL-INSULATOR-INP(100) STRUCTURES, Surface and interface analysis, 26(3), 1998, pp. 177-181
SOME APPLICATIONS OF ELASTIC PEAK ELECTRON-SPECTROSCOPY FOR SEMICONDUCTOR SURFACE STUDIES
Authors: BIDEUX L ROBERT C MERLE S GRUZZA B GOUMET E GILLAFON E
Citation: L. Bideux et al., SOME APPLICATIONS OF ELASTIC PEAK ELECTRON-SPECTROSCOPY FOR SEMICONDUCTOR SURFACE STUDIES, Surface and interface analysis, 26(12), 1998, pp. 903-907
ELECTRONS ELASTICALLY BACKSCATTERED FROM AL, AG AND AU SAMPLES
Authors: GRUZZA B ROBERT C PEUCHOT B BIDEUX L
Citation: B. Gruzza et al., ELECTRONS ELASTICALLY BACKSCATTERED FROM AL, AG AND AU SAMPLES, Vacuum, 50(1-2), 1998, pp. 237-242
SPECTROELLIPSOMETRY AND ELECTRON-SPECTROSCOPY OF POROUS SI THIN-FILMSON P(+) SUBSTRATES
Authors: ROBERT C BIDEUX L GRUZZA B CADORET M LOHNER T FRIED M VAZSONYI E GERGELY G
Citation: C. Robert et al., SPECTROELLIPSOMETRY AND ELECTRON-SPECTROSCOPY OF POROUS SI THIN-FILMSON P(+) SUBSTRATES, Thin solid films, 317(1-2), 1998, pp. 210-213
A STUDY OF INP(100) SURFACE PASSIVATION BY ANTIMONY DEPOSITION
Authors: GRUZZA B BIDEUX L MANGAT PS SOUKIASSIAN P
Citation: B. Gruzza et al., A STUDY OF INP(100) SURFACE PASSIVATION BY ANTIMONY DEPOSITION, Synthetic metals, 90(3), 1997, pp. 223-227
ELECTRICAL CHARACTERIZATION OF ALUMINA LAYERS DEPOSITED BY EVAPORATION CELL ON SI AND RESTRUCTURED INP SUBSTRATES
Authors: BENAMARA Z TIZI S CHELLALI M GRUZZA B BIDEUX L ROBERT C
Citation: Z. Benamara et al., ELECTRICAL CHARACTERIZATION OF ALUMINA LAYERS DEPOSITED BY EVAPORATION CELL ON SI AND RESTRUCTURED INP SUBSTRATES, Synthetic metals, 90(3), 1997, pp. 229-232
ELLIPSOMETRY OF AL2O3 THIN-FILMS DEPOSITED ON SI AND INP
Authors: ROBERT C BIDEUX L GRUZZA B LOHNER T FRIED M BARNA A SOMOGYI K GERGELY G
Citation: C. Robert et al., ELLIPSOMETRY OF AL2O3 THIN-FILMS DEPOSITED ON SI AND INP, Semiconductor science and technology, 12(11), 1997, pp. 1429-1432
ELASTIC REFLECTION OF ELECTRONS BY POROUS SILICON LAYERED (PSL) SURFACES - EFFECTS OF POROSITY
Authors: ROBERT C BIDEUX L GRUZZA B VAZSONYI E GERGELY G
Citation: C. Robert et al., ELASTIC REFLECTION OF ELECTRONS BY POROUS SILICON LAYERED (PSL) SURFACES - EFFECTS OF POROSITY, Applied surface science, 115(2), 1997, pp. 111-115
RETARDING-FIELD ANALYZER USED IN ELASTIC PEAK ELECTRON-SPECTROSCOPY
Authors: ZEZE D BIDEUX L GRUZZA B GOLEK F DANKO D MROZ S
Citation: D. Zeze et al., RETARDING-FIELD ANALYZER USED IN ELASTIC PEAK ELECTRON-SPECTROSCOPY, Vacuum, 48(3-4), 1997, pp. 399-401
VACUUM EVAPORATION OF THIN ALUMINA LAYERS
Authors: MATOLIN V NEHASIL V BIDEUX L ROBERT C GRUZZA B
Citation: V. Matolin et al., VACUUM EVAPORATION OF THIN ALUMINA LAYERS, Thin solid films, 289(1-2), 1996, pp. 295-299
STUDY OF AL2O3 CONDENSATION ON SI(100) AND INP(100) SUBSTRATES
Authors: BIDEUX L ROBERT C GRUZZA B MATOLIN V BENAMARA Z
Citation: L. Bideux et al., STUDY OF AL2O3 CONDENSATION ON SI(100) AND INP(100) SUBSTRATES, Surface science, 352, 1996, pp. 407-410
INTERDISCIPLINARY SURFACE STUDIES ON POROUS SI(PSI) .1. ELASTIC PEAK ELECTRON-SPECTROSCOPY (EPES), VALENCE-BAND XPS AND ATOMIC-FORCE MICROSCOPY (AFM)
Authors: GRUZZA B BIDEUX L ROBERT C SALACE G VAZSONYI E PETO G GUCZI L GERGELY G
Citation: B. Gruzza et al., INTERDISCIPLINARY SURFACE STUDIES ON POROUS SI(PSI) .1. ELASTIC PEAK ELECTRON-SPECTROSCOPY (EPES), VALENCE-BAND XPS AND ATOMIC-FORCE MICROSCOPY (AFM), Vacuum, 46(5-6), 1995, pp. 493-495
THE INTERACTION OF HYDROGEN WITH THE INP(100) SUBSTRATES STUDIED BY AES, ELASTIC PEAK ELECTRON-SPECTROSCOPY (EPES) AND EELS
Authors: PORTE A GRUZZA B BONDOT CA BIDEUX L JARDIN C GERGELY G
Citation: A. Porte et al., THE INTERACTION OF HYDROGEN WITH THE INP(100) SUBSTRATES STUDIED BY AES, ELASTIC PEAK ELECTRON-SPECTROSCOPY (EPES) AND EELS, Journal of electron spectroscopy and related phenomena, 68, 1994, pp. 391-397
ELECTRON-SPECTROSCOPY OF POROUS SILICON LAYERS INDIRECT DETECTION OF HYDROGEN BY ELASTIC PEAK ELECTRON-SPECTROSCOPY
Authors: GERGELY G GRUZZA B BIDEUX L BONDOT P JARDIN C VAZSONYI E
Citation: G. Gergely et al., ELECTRON-SPECTROSCOPY OF POROUS SILICON LAYERS INDIRECT DETECTION OF HYDROGEN BY ELASTIC PEAK ELECTRON-SPECTROSCOPY, Surface and interface analysis, 22(1-12), 1994, pp. 271-274
SOME PROBLEMS OF ELECTRON-SPECTROSCOPY (AES, EPES) USING A RETARDING-FIELD ANALYZER
Authors: SULYOK A GERGELY G GRUZZA B BIDEUX L
Citation: A. Sulyok et al., SOME PROBLEMS OF ELECTRON-SPECTROSCOPY (AES, EPES) USING A RETARDING-FIELD ANALYZER, Vacuum, 45(2-3), 1994, pp. 325-327
THE MONTE-CARLO METHOD APPLIED TO THE ELECTRONS ELASTICALLY REFLECTEDBY A COPPER SAMPLE
Authors: BONDOT F PORTE A GRUZZA B BIDEUX L MROZ S
Citation: F. Bondot et al., THE MONTE-CARLO METHOD APPLIED TO THE ELECTRONS ELASTICALLY REFLECTEDBY A COPPER SAMPLE, Vacuum, 45(2-3), 1994, pp. 337-339
STRUCTURAL AND ELECTRICAL STUDY OF [AU INP(100)] AND [AU/INSB/INP(100)] SYSTEMS/
Authors: BIDEUX L GRUZZA B PORTE A ROBERT H
Citation: L. Bideux et al., STRUCTURAL AND ELECTRICAL STUDY OF [AU INP(100)] AND [AU/INSB/INP(100)] SYSTEMS/, Surface and interface analysis, 20(9), 1993, pp. 803-807
Risultati: 1-19 |