Authors: BIECK W GNASER H OECHSNER H

Citation: W. Bieck et al., ANALYSIS OF SOLIDS WITH A SECONDARY-NEUTRAL MICROPROBE BASED ON ELECTRON-GAS POST-IONIZATION, Fresenius' journal of analytical chemistry, 353(3-4), 1995, pp. 324-328

Authors: BIECK W GNASER H OECHSNER H

Citation: W. Bieck et al., ISOTOPIC MASS EFFECTS IN LOW-ENERGY SPUTTERING OF COPPER AND MOLYBDENUM, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 101(4), 1995, pp. 335-342

Authors: BIECK W GNASER H OECHSNER H

Citation: W. Bieck et al., ANALYTICAL PERFORMANCE OF A SECONDARY-NEUTRAL MICROPROBE WITH ELECTRON-GAS POSITIONIZATION AND MAGNETIC-SECTOR MASS-SPECTROMETER, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(4), 1994, pp. 2537-2543

Authors: BIECK W GNASER H OECHSNER H

Citation: W. Bieck et al., SECONDARY-NEUTRAL MICROPROBE WITH ELECTRON-GAS POST-IONIZATION, Applied physics letters, 63(6), 1993, pp. 845-847