Citation: R. Holmestad et Cr. Birkeland, CHARGE-DENSITY DETERMINATION IN TIAL-CR AND TIAL-V USING QUANTITATIVECONVERGENT-BEAM ELECTRON-DIFFRACTION, Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties, 77(5), 1998, pp. 1231-1254
Authors:
ANDERSON SC
BIRKELAND CR
ANSTIS GR
COCKAYNE DJH
Citation: Sc. Anderson et al., AN APPROACH TO QUANTITATIVE COMPOSITIONAL PROFILING AT NEAR-ATOMIC RESOLUTION USING HIGH-ANGLE ANNULAR DARK FIELD IMAGING, Ultramicroscopy, 69(2), 1997, pp. 83-103