Authors: BOBYLEV BA KOVALEVSKAJA TE MARCHISHIN IV OVSYUK VN

Citation: Ba. Bobylev et al., CAPACITANCE-VOLTAGE PROFILING OF MULTIQUANTUM-WELL STRUCTURES, Solid-state electronics, 41(3), 1997, pp. 481-486

Authors: DEMYANENKO MA MARCHISHIN IV BOBYLEV BA

Citation: Ma. Demyanenko et al., INVESTIGATION OF DEEP LEVELS IN SEMIINSULATING GAAS BY PHOTOINDUCED-ADMITTANCE TRANSIENT SPECTROSCOPY, Semiconductors, 29(10), 1995, pp. 965-970