Authors: YUZHANG K BOISJOLLY G RIVORY J KILIAN L COLLIEX C

Citation: K. Yuzhang et al., CHARACTERIZATION OF TIO2 SIO2 MULTILAYERS BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY AND ELECTRON-ENERGY-LOSS SPECTROSCOPY/, Thin solid films, 253(1-2), 1994, pp. 299-302