Authors:
YUZHANG K
BOISJOLLY G
RIVORY J
KILIAN L
COLLIEX C
Citation: K. Yuzhang et al., CHARACTERIZATION OF TIO2 SIO2 MULTILAYERS BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY AND ELECTRON-ENERGY-LOSS SPECTROSCOPY/, Thin solid films, 253(1-2), 1994, pp. 299-302