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Citation: Cb. Lioutas et al., PHASE-TRANSFORMATION OF HYDROGEN FREE AMORPHOUS-CARBON FILMS UNDER ION-BEAM BOMBARDMENT, Carbon (New York), 36(5-6), 1998, pp. 545-548

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Citation: Dh. Tassis et al., INFLUENCE OF CONVENTIONAL FURNACE AND RAPID THERMAL ANNEALING ON THE QUALITY OF POLYCRYSTALLINE BETA-FESI2 THIN-FILMS GROWN FROM VAPOR-DEPOSITED FE SI MULTILAYERS/, Thin solid films, 310(1-2), 1997, pp. 115-122

Authors: PETALAS J LOGOTHETIDIS S BOULTADAKIS S ALOUANI M WILLS JM

Citation: J. Petalas et al., OPTICAL AND ELECTRONIC-STRUCTURE STUDY OF CUBIC AND HEXAGONAL GAN THIN-FILMS, Physical review. B, Condensed matter, 52(11), 1995, pp. 8082-8091

Authors: PETALAS J LOGOTHETIDIS S BOULTADAKIS S MARKWITZ A

Citation: J. Petalas et al., THE EFFECT OF HYDROGEN AND TEMPERATURE ON THE OPTICAL GAPS OF SILICON-NITRIDE AND COMPARATIVE STOICHIOMETRY STUDIES ON SIN THIN-FILMS, Journal of non-crystalline solids, 187, 1995, pp. 291-296

Authors: LOGOTHETIDIS S BOULTADAKIS S

Citation: S. Logothetidis et S. Boultadakis, SPECTROSCOPIC ELLIPSOMETRY STUDY OF THE INTERFACIAL STRESSES AND THEIR CORRELATION WITH MICROVOIDS IN VERY THIN THERMALLY GROWN SIO2-FILMS, Journal of applied physics, 78(9), 1995, pp. 5362-5365

Authors: BOULTADAKIS S LOGOTHETIDIS S PAPADOPOULOS A VOUROUTZIS N ZORBA P GIRGINOUDI D THANAILAKIS A

Citation: S. Boultadakis et al., SPECTROSCOPIC ELLIPSOMETRY STUDIES OF VERY THIN THERMALLY GROWN SIO2-FILMS - INFLUENCE OF OXIDATION PROCEDURE ON OXIDE QUALITY AND STRESS, Journal of applied physics, 78(6), 1995, pp. 4164-4173