Authors: BOUTCHACHA T GHIBAUDO G

Citation: T. Boutchacha et G. Ghibaudo, LOW-FREQUENCY NOISE CHARACTERIZATION OF 0.18 MU-M SI CMOS TRANSISTORS, Physica status solidi. a, Applied research, 167(1), 1998, pp. 261-270

Authors: BOUTCHACHA T GHIBAUDO G GUEGAN G SKOTNICKI T

Citation: T. Boutchacha et al., LOW-FREQUENCY NOISE CHARACTERIZATION OF 0.18-MU-M SI CMOS TRANSISTORS, Microelectronics and reliability, 37(10-11), 1997, pp. 1599-1602

Authors: BOUTCHACHA T GHIBAUDO G GUEGAN G HAOND M

Citation: T. Boutchacha et al., LOW-FREQUENCY NOISE CHARACTERIZATION OF 0.25 MU-M SI CMOS TRANSISTORS, Journal of non-crystalline solids, 216, 1997, pp. 192-197