Authors:
WALTER GH
WEBER W
BREDERLOW R
JURK R
LINNENBANK CG
SCHLUNDER C
SCHMITTLANDSIEDEL D
THEWES R
Citation: Gh. Walter et al., PRECISE QUANTITATIVE-EVALUATION OF THE HOT-CARRIER-INDUCED DRAIN SERIES RESISTANCE DEGRADATION IN LATID-N-MOSFETS, Microelectronics and reliability, 38(6-8), 1998, pp. 1063-1068