Authors:
BRENNEMANN A
PROST W
LIU Q
AUER U
TEGUDE FJ
Citation: A. Brennemann et al., MODELING INTERMIXING OF SHORT-PERIOD STRAINED-LAYER SUPERLATTICES BY MEANS OF X-RAY-DIFFRACTION ANALYSIS, Materials science & engineering. B, Solid-state materials for advanced technology, 44(1-3), 1997, pp. 87-90
Authors:
LIU Q
PROST W
BRENNEMANN A
AUER U
TEGUDE FJ
Citation: Q. Liu et al., MODELING IMPERFECTIONS OF EPITAXIAL HETEROSTRUCTURES BY MEANS OF X-RAY-DIFFRACTION ANALYSIS, Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 19(2-4), 1997, pp. 299-304
Authors:
LIU Q
BRENNEMANN A
HARDTDEGEN H
LINDNER A
PROST W
TEGUDE FJ
Citation: Q. Liu et al., CHARACTERIZATION OF HYDROGEN PASSIVATION AND CARBON SELF-COMPENSATIONOF HIGHLY C-DOPED GAAS BY MEANS OF X-RAY-DIFFRACTION, Journal of applied physics, 79(2), 1996, pp. 710-716