Authors: FAN GY DATTE P BEUVILLE E BECHE JF MILLAUD J DOWNING KH BURKARD FT ELLISMAN MH XUONG NH

Citation: Gy. Fan et al., ASIC-BASED EVENT-DRIVEN 2D DIGITAL ELECTRON COUNTER FOR TEM IMAGING, Ultramicroscopy, 70(3), 1998, pp. 107-113