Citation: Va. Bushuev et Aa. Sergeev, NEW POSSIBILITIES FOR X-RAY-DIAGNOSIS OF ATHEROSCLEROSIS USING A PHASE-CONTRAST METHOD, Technical physics letters, 24(11), 1998, pp. 851-853
Citation: Va. Bushuev et Vv. Kozak, EFFECT OF THE INTERFACIAL ROUGHNESS CORRELATION ON X-RAY-DIFFRACTION IN MULTILAYER STRUCTURES, Crystallography reports, 42(5), 1997, pp. 742-750
Citation: Va. Bushuev et al., WAVE-OPTICAL DESCRIPTION OF X-RAY PHASE-CONTRAST IMAGES OF WEAKLY ABSORBING NONCRYSTALLINE OBJECTS, Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 19(2-4), 1997, pp. 513-520
Citation: Va. Bushuev et Vv. Kozak, EVOLUTION OF INTERLAYERED ROUGHNESS CORRE LATION DURING MULTILAYER STRUCTURE FORMATION, Pis'ma v Zurnal tehniceskoj fiziki, 22(19), 1996, pp. 29-33
Citation: Va. Bushuev et al., DYNAMIC THEORY OF IMAGES GENERATED BY NON CRYSTALLINE OBJECTS IN THE METHOD OF PHASE-DISPERSIVE INTROSCOPY, Kristallografia, 41(5), 1996, pp. 808-816
Citation: Va. Bushuev, STATISTICAL DYNAMIC THEORY OF SECONDARY P ROCESSES UNDER THE X-RAY-DIFFRACTION IN CRYSTALS WITH BROKEN SURFACE-LAYERS, Fizika tverdogo tela, 37(1), 1995, pp. 249-260
Citation: Va. Bushuev et Ap. Petrakov, EFFECT OF ISOCHRONOUS ANNEALING ON THE ST RUCTURE OF SILICON-CRYSTALSIRRADIATED WITH BORON IONS, Kristallografia, 40(6), 1995, pp. 1043-1049
Citation: Va. Bushuev et Ap. Petrakov, X-RAY-DIFFRACTION STUDY OF STRAIN AND AMO RPHIZATION PROFILES OF SUBSURFACE LAYERS IN SILICON SINGLE-CRYSTALS AS FUNCTIONS OF BORON-ION IMPLANTATION DOSE, Kristallografia, 40(6), 1995, pp. 1050-1055
Citation: Va. Bushuev, EFFECT OF MULTIPLE DIFFUSE-SCATTERING ON LAUE X-RAY-DIFFRACTION BY CRYSTALS WITH UNIFORMLY DISTRIBUTED MICRODEFECTS, Kristallografia, 39(6), 1994, pp. 983-990
Citation: Va. Bushuev, THE INFLUENCE OF DIFFUSE-SCATTERING ON TH E ANGULAR DEPENDENCES OF THE YIELD OF SECONDARY PROCESSES EXCITED BY A STANDING X-RAY WAVE IN CRYSTALS WITH STRUCTURAL DEFECTS, Kristallografia, 39(5), 1994, pp. 803-810
Citation: Va. Bushuev, THE INFLUENCE OF DIFFUSE-SCATTERING ON TH E ANGULAR DEPENDENCES OF THE YIELD OF SECONDARY PROCESSES EXCITED BY A STANDING X-RAY WAVE IN CRYSTALS WITH STRUCTURAL DEFECTS, Kristallografia, 39(5), 1994, pp. 803-810
Citation: Va. Bushuev et Mn. Orudzhaliev, THE FINE-STRUCTURE OF X-RAY-BEAMS LEAVING A BAND-LIKE WAVE-GUIDE, Vestnik Moskovskogo universiteta. Seria 3. Fizika, astronomia, 34(3), 1993, pp. 46-52
Authors:
LOMOV AA
BUSHUEV VA
SHITOV NV
ALEKSANDROV PA
BARANOV AI
Citation: Aa. Lomov et al., DISCOVERY OF A STRUCTURAL PHASE-TRANSITION IN THE NEAR-SURFACE LAYER OF CSDSO4 BY TRIPLE CRYSTAL X-RAY-DIFFRACTOMETRY, Fizika tverdogo tela, 35(2), 1993, pp. 299-305
Citation: Va. Bushuev et Ap. Petrakov, X-RAY DIFFRACTOMETRIC STUDY OF THE EFFECT OF LASER ANNEALING ON THE STRUCTURE OF ION-IMPLANTED SILICON SUBSURFACE LAYERS, Fizika tverdogo tela, 35(2), 1993, pp. 355-364
Citation: Va. Bushuev et al., STUDY OF SURFACE HETEROGENEOUS DEFORMATIO N IN1-XGAXP-(111)GAAS EPITAXIAL STRUCTURE, Pis'ma v Zurnal tehniceskoj fiziki, 19(23), 1993, pp. 74-78
Citation: Va. Bushuev et Mn. Orudzhaliev, STRUCTURE OF ELECTROMAGNETIC-FIELD IN UNI FORMLY BENT STRIP-LIKE WAVE-GUIDES OF X-RAY RANGE, Zurnal tehniceskoj fiziki, 63(9), 1993, pp. 89-98