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Results: 1-25 | 26-50 | 51-56 |
Results: 51-56/56
Applying medical survival data to estimate the three-parameter Weibull distribution by the method of probability-weighted moments
Authors: Bartolucci, AA Singh, KP Bartolucci, AD Bae, S
Citation: Aa. Bartolucci et al., Applying medical survival data to estimate the three-parameter Weibull distribution by the method of probability-weighted moments, MATH COMP S, 48(4-6), 1999, pp. 385-392
The structure and degradation mechanism of SrBi2Ta2O9 thin films
Authors: Kim, H Bae, S Kim, J Kim, T Kim, I Lee, H Jeong, J
Citation: H. Kim et al., The structure and degradation mechanism of SrBi2Ta2O9 thin films, J KOR PHYS, 35, 1999, pp. S1214-S1218
An approximate method for generating draft on a free-form surface
Authors: Tokuyama, Y Bae, S
Citation: Y. Tokuyama et S. Bae, An approximate method for generating draft on a free-form surface, VIS COMPUT, 15(1), 1999, pp. 1-8
Estimation of transition rates in a multi-state proportional hazards model
Authors: Singh, KP Bae, S Bartolucci, AA Chowdhury, RI Islam, MA",Warsono
Citation: Kp. Singh et al., Estimation of transition rates in a multi-state proportional hazards model, ENVIRON INT, 25(6-7), 1999, pp. 781-785
A new bifunctional topography and current probe for scanning force microscope testing of integrated circuits
Authors: Bae, S Schiemann, K Mertin, W Kubalek, E Maywald, M
Citation: S. Bae et al., A new bifunctional topography and current probe for scanning force microscope testing of integrated circuits, MICROEL REL, 39(6-7), 1999, pp. 975-980
Pathway to depositing device-quality 50 degrees C silicon nitride in a high-density plasma system
Authors: Farber, DG Bae, S Okandan, M Reber, DM Kuzma, T Fonash, SJ
Citation: Dg. Farber et al., Pathway to depositing device-quality 50 degrees C silicon nitride in a high-density plasma system, J ELCHEM SO, 146(6), 1999, pp. 2254-2257
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