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Results:
1-4
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Results: 4
Facet degradation of high-power diode laser arrays
Authors:
Tomm, JW Thamm, E Barwolff, A Elsaesser, T Luft, J Baeumler, M Mueller, S Jantz, W Rechenberg, I Erbert, G
Citation:
Jw. Tomm et al., Facet degradation of high-power diode laser arrays, APPL PHYS A, 70(4), 2000, pp. 377-381
Quantitative topographic assessment of Cu incorporation in GaAs
Authors:
Baeumler, M Stibal, R Stolz, W Steinegger, T Jurisch, M Maier, M Jantz, W
Citation:
M. Baeumler et al., Quantitative topographic assessment of Cu incorporation in GaAs, J CRYST GR, 210(1-3), 2000, pp. 207-211
Luminescence imaging - a well-established technique to study material- anddevice-related problems
Authors:
Baeumler, M Fitz, C Weinberg, U Wagner, J Jantz, W
Citation:
M. Baeumler et al., Luminescence imaging - a well-established technique to study material- anddevice-related problems, MAT SCI E B, 66(1-3), 1999, pp. 131-140
Optical and structural analysis of degraded high power InGaAlAs/AlGaAs lasers
Authors:
Frigeri, C Baeumler, M Migliori, A Muller, S Weyher, JL Jantz, W
Citation:
C. Frigeri et al., Optical and structural analysis of degraded high power InGaAlAs/AlGaAs lasers, MAT SCI E B, 66(1-3), 1999, pp. 209-214
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