Authors: Ballarotto, VW Siegrist, K Phaneuf, RJ Williams, ED Yang, WC Nemanich, RJ

Citation: Vw. Ballarotto et al., Photon energy dependence of contrast in photoelectron emission microscopy of Si devices, APPL PHYS L, 78(22), 2001, pp. 3547-3549

Authors: Ballarotto, VW Siegrist, K Phaneuf, RJ Williams, ED Mogren, S

Citation: Vw. Ballarotto et al., PEEM imaging of dopant contrast in Si(001), SURF SCI, 461(1-3), 2000, pp. L570-L574

Authors: Ballarotto, VW Little, ME Kordesch, ME

Citation: Vw. Ballarotto et al., Orientation of aluminum nitride films grown with hyperthermal molecular beams, J CRYST GR, 218(2-4), 2000, pp. 173-180