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Citation: Jd. Baniecki et al., Hydrogen induced tunnel emission in Pt/(BaxSr1-x)Ti1+yO3+z/Pt thin film capacitors, J APPL PHYS, 89(5), 2001, pp. 2873-2885

Authors: Baniecki, JD Laibowitz, RB Shaw, TM Saenger, KL Duncombe, PR Cabral, C Kotecki, DE Shen, H Lian, J Ma, QY

Citation: Jd. Baniecki et al., Effects of annealing conditions on charge loss mechanisms in MOCVD Ba0.7Sr0.3TiO3 thin film capacitors, J EUR CERAM, 19(6-7), 1999, pp. 1457-1461

Authors: Kotecki, DE Baniecki, JD Shen, H Laibowitz, RB Saenger, KL Lian, JJ Shaw, TM Athavale, SD Cabral, C Duncombe, PR Gutsche, M Kunkel, G Park, YJ Wang, YY Wise, R

Citation: De. Kotecki et al., (Ba,Sr)TiO3 dielectrics for future stacked-capacitor DRAM, IBM J RES, 43(3), 1999, pp. 367-382

Authors: Shaw, TM Suo, Z Huang, M Liniger, E Laibowitz, RB Baniecki, JD

Citation: Tm. Shaw et al., The effect of stress on the dielectric properties of barium strontium titanate thin films, APPL PHYS L, 75(14), 1999, pp. 2129-2131