Authors: Kim, Y Park, KH Choi, WC Chung, TH Bark, HJ Yi, JY Jeong, J

Citation: Y. Kim et al., Charge retention effect in metal-oxide-semiconductor structure containing Si nanocrystals prepared by ion-beam-assisted electron beam deposition, MAT SCI E B, 83(1-3), 2001, pp. 145-151

Authors: Kim, Y Park, KH Chung, TH Bark, HJ Yi, JY Choi, WC Kim, EK Lee, JW Lee, JY

Citation: Y. Kim et al., Ultralarge capacitance-voltage hysteresis and charge retention characteristics in metal oxide semiconductor structure containing nanocrystals deposited by ion-beam-assisted electron beam deposition, APPL PHYS L, 78(7), 2001, pp. 934-936