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Results:
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Results: 1
XAFS and X-ray reflectivity study of III-V compound native oxide/GaAs interfaces
Authors:
Cheong, SK Bunker, BA Hall, DC Snider, GL Barrios, PJ
Citation:
Sk. Cheong et al., XAFS and X-ray reflectivity study of III-V compound native oxide/GaAs interfaces, J SYNCHROTR, 8, 2001, pp. 824-826
Risultati:
1-1
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