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Results: 1-7 |
Results: 7
Progress in aberration-corrected scanning transmission electron microscopy
Authors: Dellby, N Krivanek, OL Nellist, PD Batson, PE Lupini, AR
Citation: N. Dellby et al., Progress in aberration-corrected scanning transmission electron microscopy, J ELEC MICR, 50(3), 2001, pp. 177-185
Structural and electronic characterization of a dissociated 60 degrees dislocation in GeSi
Authors: Batson, PE
Citation: Pe. Batson, Structural and electronic characterization of a dissociated 60 degrees dislocation in GeSi, PHYS REV B, 61(24), 2000, pp. 16633-16641
Near-edge conduction band electronic states in SiGe alloys
Authors: Batson, PE
Citation: Pe. Batson, Near-edge conduction band electronic states in SiGe alloys, J ELEC MICR, 49(2), 2000, pp. 267-273
Atomic resolution analytical microscopy
Authors: Batson, PE
Citation: Pe. Batson, Atomic resolution analytical microscopy, IBM J RES, 44(4), 2000, pp. 477-487
Atomic resolution EELS analysis of a misfit dislocation at a GeSi/Si interface
Authors: Batson, PE
Citation: Pe. Batson, Atomic resolution EELS analysis of a misfit dislocation at a GeSi/Si interface, PHYSICA B, 274, 1999, pp. 593-597
Advanced spatially resolved EELS in the STEM
Authors: Batson, PE
Citation: Pe. Batson, Advanced spatially resolved EELS in the STEM, ULTRAMICROS, 78(1-4), 1999, pp. 33-42
Atomic and electronic structure of a dissociated 60 degrees misfit dislocation in GexSi(1-x)
Authors: Batson, PE
Citation: Pe. Batson, Atomic and electronic structure of a dissociated 60 degrees misfit dislocation in GexSi(1-x), PHYS REV L, 83(21), 1999, pp. 4409-4412
Risultati: 1-7 |